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H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Stress Probability Computation for Estimating NBTI-Induced Delay Degradation," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, E94-A(12), pp. 2545--2553, December 2011.
ID 309
分類 論文誌
タグ computation degradation delay estimating nbti-induced probability stress
表題 (title) Stress Probability Computation for Estimating NBTI-Induced Delay Degradation
表題 (英文)
著者名 (author) H. Konoura,Y. Mitsuyama,M. Hashimoto,T. Onoye
英文著者名 (author) H. Konoura,Y. Mitsuyama,M. Hashimoto,T. Onoye
キー (key) H. Konoura,Y. Mitsuyama,M. Hashimoto,T. Onoye
定期刊行物名 (journal) IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences
定期刊行物名 (英文)
巻数 (volume) E94-A
号数 (number) 12
ページ範囲 (pages) 2545--2553
刊行月 (month) 12
出版年 (year) 2011
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル 166.pdf (application/pdf) [一般閲覧可]
BiBTeXエントリ
@article{id309,
         title = {Stress Probability Computation for Estimating {NBTI-Induced} Delay Degradation},
        author = {H. Konoura and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences},
        volume = {E94-A},
        number = {12},
         pages = {2545--2553},
         month = {12},
          year = {2011},
}