Detail of a work
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| H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Stress Probability Computation for Estimating NBTI-Induced Delay Degradation," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, E94-A(12), pp. 2545--2553, December 2011. | |
| ID | 309 |
| 分類 | 論文誌 |
| タグ | computation degradation delay estimating nbti-induced probability stress |
| 表題 (title) |
Stress Probability Computation for Estimating NBTI-Induced Delay Degradation |
| 表題 (英文) |
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| 著者名 (author) |
H. Konoura,Y. Mitsuyama,M. Hashimoto,T. Onoye |
| 英文著者名 (author) |
H. Konoura,Y. Mitsuyama,M. Hashimoto,T. Onoye |
| キー (key) |
H. Konoura,Y. Mitsuyama,M. Hashimoto,T. Onoye |
| 定期刊行物名 (journal) |
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
E94-A |
| 号数 (number) |
12 |
| ページ範囲 (pages) |
2545--2553 |
| 刊行月 (month) |
12 |
| 出版年 (year) |
2011 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 166.pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id309,
title = {Stress Probability Computation for Estimating {NBTI-Induced} Delay Degradation},
author = {H. Konoura and Y. Mitsuyama and M. Hashimoto and T. Onoye},
journal = {IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences},
volume = {E94-A},
number = {12},
pages = {2545--2553},
month = {12},
year = {2011},
}
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