この検索内の頻出タグ: degradation^:2 characteristics^:1 computation^:1 countermeasures^:1 delay^:1 design^:1 device^:1 estimating^:1 nbti-induced^:1 probability^:1 stress^:1 time-dependent^:1

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論文誌

[1] H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Stress Probability Computation for Estimating NBTI-Induced Delay Degradation," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E94-A, number 12, pages 2545--2553, December 2011. [166.pdf]

著書

[1] T. Sato, M. Hashimoto, S. Tanakamaru, K. Takeuchi, Y. Sato, S. Kajihara, M. Yoshimoto, J. Jung, Y. Kimi, H. Kawaguchi, H. Shimada, and J. Yao, "Time-Dependent Degradation in Device Characteristics and Countermeasures by Design," Book chapter, VLSI Design and Test for Systems Dependability, Springer, August 2018.