この検索内の頻出タグ: characteristics^:2 countermeasures^:1 degradation^:1 design^:1 device^:1 extraction^:1 interconnect^:1 rl^:1 time-dependent^:1 transfer^:1 transmission-line^:1

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論文誌

[1] A. Tsuchiya, M. Hashimoto, and H. Onodera, "Interconnect RL Extraction Based on Transfer Characteristics of Transmission-Line," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E89-A, number 12, pages 3585-3593, December 2006. [2.pdf]

著書

[1] T. Sato, M. Hashimoto, S. Tanakamaru, K. Takeuchi, Y. Sato, S. Kajihara, M. Yoshimoto, J. Jung, Y. Kimi, H. Kawaguchi, H. Shimada, and J. Yao, "Time-Dependent Degradation in Device Characteristics and Countermeasures by Design," Book chapter, VLSI Design and Test for Systems Dependability, Springer, August 2018.