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この検索内の頻出タグ: characteristics:1 countermeasures:1 degradation:1 design:1 device:1 time-dependent:1

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著書
[1] T. Sato, M. Hashimoto, S. Tanakamaru, K. Takeuchi, Y. Sato, S. Kajihara, M. Yoshimoto, J. Jung, Y. Kimi, H. Kawaguchi, H. Shimada, and J. Yao, "Time-Dependent Degradation in Device Characteristics and Countermeasures by Design," Book chapter, VLSI Design and Test for Systems Dependability, Springer, August 2018.