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論文誌

[1] H. Konoura, D. Alnajjar, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, K. Wakabayashi, M. Hashimoto, T. Onoye, and H. Onodera, "Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-Based Design and Its Irradiation Testing," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E97-A, number 12, pages 2518--2529, December 2014. [210.pdf]

国際会議

[1] M. Hashimoto, D. Alnajjar, H. Konoura, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, K. Wakabayashi, T. Onoye, and H. Onodera, "Reliability-Configurable Mixed-Grained Reconfigurable Array Compatible with High-Level Synthesis," Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC), pages 14--15, January 2015. [213.pdf]

[2] D. Alnajjar, H. Konoura, Y. Mitsuyama, H. Shimada, K. Kobayashi, H. Kanbara, H. Ochi, T. Imagawa, S. Noda, K. Wakabayashi, M. Hashimoto, T. Onoye, and H. Onodera, "Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-To-Array Mapping and Its Radiation Testing," Proceedings of IEEE Asian Solid-State Circuits Conference (A-SSCC), pages 313--316, November 2013. [196.pdf]

著書

[1] T. Sato, M. Hashimoto, S. Tanakamaru, K. Takeuchi, Y. Sato, S. Kajihara, M. Yoshimoto, J. Jung, Y. Kimi, H. Kawaguchi, H. Shimada, and J. Yao, "Time-Dependent Degradation in Device Characteristics and Countermeasures by Design," Book chapter, VLSI Design and Test for Systems Dependability, Springer, August 2018.