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T. Sato, M. Hashimoto, S. Tanakamaru, K. Takeuchi, Y. Sato, S. Kajihara, M. Yoshimoto, J. Jung, Y. Kimi, H. Kawaguchi, H. Shimada, and J. Yao, "Time-Dependent Degradation in Device Characteristics and Countermeasures by Design," Book chapter, VLSI Design and Test for Systems Dependability, Springer, August 2018.
ID 494
分類 著書
タグ characteristics countermeasures degradation design device time-dependent
表題 (title) Time-Dependent Degradation in Device Characteristics and Countermeasures by Design
表題 (英文)
著者名 (author) T. Sato, M. Hashimoto, S. Tanakamaru, K. Takeuchi, Y. Sato, S. Kajihara, M. Yoshimoto, J. Jung, Y. Kimi, H. Kawaguchi, H. Shimada, J. Yao
英文著者名 (author)
キー (key)
定期刊行物名 (journal) Book chapter, VLSI Design and Test for Systems Dependability, Springer
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) 8
出版年 (year) 2018
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@article{id494,
         title = {Time-Dependent Degradation in Device Characteristics and Countermeasures by Design},
        author = {T. Sato and  M. Hashimoto and   S. Tanakamaru and  K. Takeuchi and  Y. Sato and  S. Kajihara and  M. Yoshimoto and  J. Jung and  Y. Kimi and  H. Kawaguchi and  H. Shimada and  J. Yao},
       journal = {Book chapter, VLSI Design and Test for Systems Dependability,  Springer},
         month = {8},
          year = {2018},
}