この検索内の頻出タグ: delay^:2 probability^:2 stress^:2 circuit/instance/transistor-level^:1 comparative^:1 computation^:1 consideration^:1 degradation^:1 degrading^:1 due^:1 estimating^:1 estimation^:1 nbti^:1 nbti-induced^:1 study^:1

2 件の該当がありました． : このページのURL : HTML

論文誌

[1] H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Stress Probability Computation for Estimating NBTI-Induced Delay Degradation," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E94-A, number 12, pages 2545--2553, December 2011. [166.pdf]

国際会議

[1] H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Comparative Study on Delay Degrading Estimation Due to NBTI with Circuit/Instance/Transistor-Level Stress Probability Consideration," Proceedings of International Symposium on Quality Electronic Design (ISQED), pages 646--651, March 2010. [137.pdf]