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論文誌

[1] K. Ito, Y. Zhang, H. Itsuji, T. Uezono, T. Toba, and M. Hashimoto, "Analyzing DUE Errors on GPUs with Neutron Irradiation Test and Fault Injection to Control Flow," IEEE Transactions on Nuclear Science, volume 68, number 8, pages 1668--1674, August 2021. [pdf]

[2] T. Enami, K. Shinkai, S. Ninomiya, S. Abe, and M. Hashimoto, "Statistical Timing Analysis Considering Clock Jitter and Skew Due to Power Supply Noise and Process Variation," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E93-A, number 12, pages 2399--2408, December 2010. [148.pdf]

国際会議

[1] K. Ito, Y. Zhang, H. Itsuji, T. Uezono, T. Toba, and M. Hashimoto, "Analyzing DUE Errors with Neutron Irradiation Test and Fault Injection to Control Flow," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2020.

[2] Y. Takai, Y. Ogasahara, M. Hashimoto, and T. Onoye, "Measurement of On-Chip I/O Power Supply Noise and Correlation Verification between Noise Magnitude and Delay Increase Due to SSO," Proceedings of IEEE Workshop on Signal Propagation on Interconnects (SPI), pages 19--20, May 2010. [139.pdf]

[3] H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Comparative Study on Delay Degrading Estimation Due to NBTI with Circuit/Instance/Transistor-Level Stress Probability Consideration," Proceedings of International Symposium on Quality Electronic Design (ISQED), pages 646--651, March 2010. [137.pdf]