Table of works
Frequent tags in this search: due:5 analyzing:2 control:2 delay:2 errors:2 fault:2 flow:2 injection:2 irradiation:2 neutron:2 noise:2 power:2 supply:2 test:2 analysis:1 circuit/instance/transistor-level:1 clock:1 comparative:1 consideration:1 considering:1 correlation:1 degrading:1 estimation:1 gpus:1 i/o:1 increase:1 jitter:1 magnitude:1 measurement:1 nbti:1
5 publications are found. : URL for this page. : HTML
| Author (author) | Title (title) | Journal/Conference | Volume / Number | Pages (pages) | Published date | Impact factor / Acceptance | File | |
|---|---|---|---|---|---|---|---|---|
| Academic Journal |
, Y. Zhang, , , , M. Hashimoto |
Analyzing DUE Errors on GPUs with Neutron Irradiation Test and Fault Injection to Control Flow |
IEEE Transactions on Nuclear Science | 68(8) |
1668--1674 |
August 2021 |
pdf | |
| Academic Journal |
T. Enami, K. Shinkai, S. Ninomiya, S. Abe, M. Hashimoto |
Statistical Timing Analysis Considering Clock Jitter and Skew Due to Power Supply Noise and Process Variation |
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences | E93-A(12) |
2399--2408 |
December 2010 |
148.pdf | |
| International Conference |
, Y. Zhang, , , , M. Hashimoto |
Analyzing DUE Errors with Neutron Irradiation Test and Fault Injection to Control Flow |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) | October 2020 |
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| International Conference |
Y. Takai, Y. Ogasahara, M. Hashimoto, T. Onoye |
Measurement of On-Chip I/O Power Supply Noise and Correlation Verification between Noise Magnitude and Delay Increase Due to SSO |
Proceedings of IEEE Workshop on Signal Propagation on Interconnects (SPI) | 19--20 |
May 2010 |
139.pdf | ||
| International Conference |
H. Konoura, Y. Mitsuyama, M. Hashimoto, T. Onoye |
Comparative Study on Delay Degrading Estimation Due to NBTI with Circuit/Instance/Transistor-Level Stress Probability Consideration |
Proceedings of International Symposium on Quality Electronic Design (ISQED) | 646--651 |
March 2010 |
137.pdf |