: Y. Takai, Y. Ogasahara, M. Hashimoto, and T. Onoye, Measurement of On-Chip I/O Power Supply Noise and Correlation Verification between Noise Magnitude and Delay Increase Due to SSO, May 2010.
Detail of a work
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| Y. Takai, Y. Ogasahara, M. Hashimoto, and T. Onoye, "Measurement of On-Chip I/O Power Supply Noise and Correlation Verification between Noise Magnitude and Delay Increase Due to SSO," Proceedings of IEEE Workshop on Signal Propagation on Interconnects (SPI), pp. 19--20, May 2010. | |
| ID | 270 |
| 分類 | 国際会議 |
| タグ | correlation delay due i/o increase magnitude measurement noise on-chip power sso supply verification |
| 表題 (title) |
Measurement of On-Chip I/O Power Supply Noise and Correlation Verification between Noise Magnitude and Delay Increase Due to SSO |
| 表題 (英文) |
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| 著者名 (author) |
Y. Takai,Y. Ogasahara,M. Hashimoto,T. Onoye |
| 英文著者名 (author) |
Y. Takai,Y. Ogasahara,M. Hashimoto,T. Onoye |
| キー (key) |
Y. Takai,Y. Ogasahara,M. Hashimoto,T. Onoye |
| 定期刊行物名 (journal) |
Proceedings of IEEE Workshop on Signal Propagation on Interconnects (SPI) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
19--20 |
| 刊行月 (month) |
5 |
| 出版年 (year) |
2010 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 139.pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id270,
title = {Measurement of On-chip I/O Power Supply Noise and Correlation Verification between Noise Magnitude and Delay Increase due to {SSO}},
author = {Y. Takai and Y. Ogasahara and M. Hashimoto and T. Onoye},
journal = {Proceedings of IEEE Workshop on Signal Propagation on Interconnects (SPI)},
pages = {19--20},
month = {5},
year = {2010},
}
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