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この検索内の頻出タグ: correlation:1 delay:1 due:1 i/o:1 increase:1 magnitude:1 measurement:1 noise:1 on-chip:1 power:1 sso:1 supply:1 verification:1

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国際会議
[1] Y. Takai, Y. Ogasahara, M. Hashimoto, and T. Onoye, "Measurement of On-Chip I/O Power Supply Noise and Correlation Verification between Noise Magnitude and Delay Increase Due to SSO," Proceedings of IEEE Workshop on Signal Propagation on Interconnects (SPI), pages 19--20, May 2010. [139.pdf]