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BibTeX list of works

27 件の該当がありました． : このページのURL : HTML

@article{id690,
         title = {Quasi Event-Wise Measurement and Simulation of Neutron-Induced Multiple-Cell Upsets in {22-nm} and {55-nm} {SRAMs}},
        author = {Yuibi Gomi and Kazusa Takami and Ryuichi Yasuda and Hiroki Kanda and Mitsuhiro Fukuda and Masanori Hashimoto},
       journal = {IEEE Transactions on Nuclear Science},
         month = {0},
          year = {(to appear)},
}

@article{id680,
         title = {Measurement of production branching ratio after muon nuclear capture reaction of Al and Si isotopes},
        author = {R. Mizuno and M. Niikura and T.Y. Saito and T. Matsuzaki and S. Abe and H. Fukuda and M. Hashimoto and A. Hillier and K. Ishida and N. Kawamura and S. Kawase and T. Kawata and K. Kitafuji and F. Minato and M. Oishi and A. Sato and K. Shimomura and P. Strasser and S. Takeshita and D. Tomono and Y. Watanabe},
       journal = {Physical Review C},
        volume = {112},
        number = {26},
         pages = {054305},
         month = {11},
          year = {2025},
}

@article{id671,
         title = {A {55-nm} {SRAM} Chip Scanning Errors Every 125 {ns} for Event-Wise Soft Error Measurement},
        author = {Y. Gomi and A. Sato and W. Madany and K. Okada and S. Adachi and M. Itoh and M.Hashimoto},
       journal = {IEEE Solid-State Circuits Letters},
        volume = {8},
         pages = {245-248},
         month = {9},
          year = {2025},
}

@article{id543,
         title = {Measurement of Single-Event Upsets in {65-nm} {SRAMs} Under Irradiation of Spallation Neutrons at {J-PARC} {MLF}},
        author = {J. Kuroda and S. Manabe and Y. Watanabe and K. Ito and W. Liao and M. Hashimoto and S. Abe and M. Harada and K. Oikawa and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {67},
        number = {7},
         pages = {1599 -- 1605},
         month = {7},
          year = {2020},
}

@article{id508,
         title = {Characterizing {SRAM} and {FF} Soft Error Rates with Measurement and Simulation (Invited)},
        author = {M. Hashimoto and K. Kobayashi and J. Furuta and S. Abe and Y. Watanabe},
       journal = {Integration, the VLSI Journal},
        volume = {69},
         pages = {161--179},
         month = {11},
          year = {2019},
}

@article{id477,
         title = {Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in {65-nm} Bulk {SRAMs}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and K. Nakano and H. Sato and T. Kin and K. Hamada and M. Tampo and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {65},
        number = {8},
         pages = {1734--1741},
         month = {8},
          year = {2018},
}

@article{id376,
         title = {{SET} Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-die Process Variation Effects},
        author = {R. Harada and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences},
        volume = {E97-A},
        number = {7},
         pages = {1461--1467},
         month = {7},
          year = {2014},
}

@article{id345,
         title = {Measurement and Analysis of {Alpha-Particle-Induced} Soft Errors and Multiple Cell Upsets in {10T} Subthreshold {SRAM}},
        author = {H. Fuketa and R. Harada and M. Hashimoto and T. Onoye},
       journal = {IEEE Transactions on Device and Materials Reliability},
        volume = {14},
        number = {1},
         pages = {463 -- 470},
         month = {3},
          year = {2014},
}

@article{id336,
         title = {Impact of {NBTI-Induced} Pulse-Width Modulation on {SET} Pulse-Width Measurement},
        author = {R. Harada and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {60},
        number = {4},
         pages = {2630--2634},
         month = {8},
          year = {2013},
}

@article{id275,
         title = {Measurement Circuits for Acquiring {SET} Pulse Width  Distribution with {Sub-FO1-inverter-delay} Resolution},
        author = {R. Harada and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences},
        volume = {E93-A},
        number = {12},
         pages = {2417--2423},
         month = {12},
          year = {2010},
}

@article{id180,
         title = {Validation of a Full-Chip Simulation Model for Supply Noise and Delay Dependence on Average Voltage Drop with On-chip Delay Measurement},
        author = {Y. Ogasahara and T. Enami and M. Hashimoto and T. Sato and T. Onoye},
       journal = {IEEE Transactions on Circuits and Systems II},
        volume = {54},
        number = {10},
         pages = {868--872},
         month = {10},
          year = {2007},
}

@article{id691,
         title = {Study of excited states populated by muon nuclear capture based on the production branching ratio  measurement},
        author = {R. Mizuno and  M. Niikura and  T.Y. Saito and  T. Matsuzaki and  S. Abe and  H. Fukuda and  M.  Hashimoto and  A. D. Hillier and  K. Ishida and  N. Kawamura and  S. Kawase and  T. Kawata and  K. Kitafuji and   F. Minato and  M. Oishi and  A. Sato and  K. Shimomura and  P. Strasser and  S. Takeshita and  D. Tomono and   Y. Watanabe},
       journal = {The 5th Conference on Advances in Radioactive Isotope Science (ARIS2026)},
         month = {0},
          year = {(to appear)},
}

@article{id695,
         title = {Study of excited states populated by muon nuclear capture based on the production branching ratio measurement},
        author = {R. Mizuno and  M. Niikura and  T.Y. Saito and  T. Matsuzaki and  S. Abe and  H. Fukuda and  M.  Hashimoto and  A. D. Hillier and  K. Ishida and  N. Kawamura and  S. Kawase and  T. Kawata and  K. Kitafuji and   F. Minato and  M. Oishi and  A. Sato and  K. Shimomura and  P. Strasser and  S. Takeshita and  D. Tomono and  Y. Watanabe},
       journal = {The 8th international workshop on Compound-Nuclear Reactions and Related Topics},
         month = {0},
          year = {(to appear)},
}

@article{id686,
         title = {Proton-Induced Distant {MCU} Analysis with Quasi Event-Wise Dynamic Measurement in {22-nm} and {55-nm} {SRAMs}},
        author = {Yuibi Gomi and Kazusa Takami and Koyo Morita and Masanori Hashimoto},
       journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
         month = {3},
          year = {2026},
}

@article{id666,
         title = {Quasi Event-Wise Measurement of Neutron-Induced Multiple-Cell Upsets in {22-nm} and {55-nm} {SRAMs}},
        author = {Y. Gomi and K. Takami and R. Yasuda and H. Kanda and M. Fukuda and M. Hashimoto},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2025},
}

@article{id634,
         title = {In-beam activation measurement of muon nuclear capture reaction on Si isotopes},
        author = {R. Mizuno and  M. Niikura and  T. Y. Saito and  T. Matsuzaki and  S. Abe and  H. Fukuda and  M. Hashimoto and  K. Ishida and  N. Kawamura and  S. Kawase and  M. Oishi and  P. Strasser and  A. Sato and  K. Shimomura and  S. Takeshita and  I. Umegaki and  A. Hillier and  T. Kawata and  K. Kitafuji and  Y. Yamaguchi and  D. Tomono and  F. Minato},
       journal = {The workshop on frontier nuclear studies with gamma-ray spectrometer arrays (gamma24)},
         month = {3},
          year = {2024},
}

@article{id630,
         title = {Measurement of muon-induced nuclear transmutation for Si isotopes},
        author = {R. Mizuno and  M. Niikura and  T. Y. Saito and  S. Abe and  H. Fukuda and  M. Hashimoto and  K. Ishida and  N. Kawamura and  S. Kawase and  T. Matsuzaki and  M. Oishi and  P. Strasser and  A. Sato and  K. Shimomura and  S. Takeshita and  I. Umegaki},
       journal = {Trans-scale Quantum Science Institute},
         month = {11},
          year = {2022},
}

@article{id521,
         title = {Measurement of Single-Event Upsets in {65-nm} Bulk {SRAMs} Under Irradiation of Spallation Neutrons at {J-PARC} {MLF}},
        author = {J. Kuroda and S. Manabe and Y. Watanabe and K. Ito and W. Liao and M. Hashimoto and S. Abe and M. Harada and K. Oikawa and Y. Miyake},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2019},
}

@article{id453,
         title = {Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk {SRAMs}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and K. Nakano and H. Sato and T. Kin and K. Hamada and M. Tampo and Y. Miyake},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {10},
          year = {2017},
}

@article{id379,
         title = {Measurement of Alpha- and Neutron-Induced {SEU} and {MCU} on {SOTB} and Bulk 0.4 V {SRAMs}},
        author = {R. Harada and S. Hirokawa and M. Hashimoto},
       journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
         month = {7},
          year = {2014},
}

@article{id319,
         title = {Impact of {NBTI-Induced} Pulse-Width Modulation on {SET} Pulse-Width Measurement},
        author = {R. Harada and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2012},
}

@article{id315,
         title = {{SET} Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-die Process Variation Effects},
        author = {R. Harada and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
         month = {4},
          year = {2012},
}

@article{id297,
         title = {{MTTF} Measurement Under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability},
        author = {D. Alnajjar and H. Kounoura and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE)},
         month = {3},
          year = {2011},
}

@article{id270,
         title = {Measurement of On-chip I/O Power Supply Noise and Correlation Verification between Noise Magnitude and Delay Increase due to {SSO}},
        author = {Y. Takai and Y. Ogasahara and M. Hashimoto and T. Onoye},
       journal = {Proceedings of IEEE Workshop on Signal Propagation on Interconnects (SPI)},
         pages = {19--20},
         month = {5},
          year = {2010},
}

@article{id259,
         title = {Measurement Circuits for Acquiring {SET} Pulse Width Distribution with {Sub-FO1-inverter-delay} Resolution},
        author = {R. Harada and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {Proceedings of International Symposium on Quality Electronic Design (ISQED)},
         pages = {839--844},
         month = {3},
          year = {2010},
}

@article{id192,
         title = {Dynamic Supply Noise Measurement Circuit Composed of Standard Cells Suitable for In-Site {SoC} Power Integrity Verification},
        author = {Y. Ogasahara and M. Hashimoto and T. Onoye},
       journal = {Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC)},
         pages = {107--108},
         month = {1},
          year = {2008},
}

@inproceedings{id55,
         title = {Design and Measurement of 6.4 Gbps 8:1 Multiplexer in 0.18um {CMOS} Process},
        author = {A. Shinmyo and M. Hashimoto and H. Onodera},
     booktitle = {Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC)},
         pages = {D9-D10},
         month = {1},
          year = {2005},
}