Academic Journal
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A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement
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IEEE Solid-State Circuits Letters
| 8
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245-248
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September 2025
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| pdf
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Academic Journal
|
, S. Manabe, Y. Watanabe, , W. Liao, M. Hashimoto, S. Abe, , , Y. Miyake
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Measurement of Single-Event Upsets in 65-nm SRAMs under Irradiation of Spallation Neutrons at J-PARC MLF
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IEEE Transactions on Nuclear Science
| 67(7)
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1599 -- 1605
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July 2020
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| pdf
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Academic Journal
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M. Hashimoto, K. Kobayashi, , S. Abe, Y. Watanabe
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Characterizing SRAM and FF Soft Error Rates with Measurement and Simulation (Invited)
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Integration, the VLSI Journal
| 69
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161--179
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November 2019
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| pdf
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Academic Journal
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W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, Y. Miyake
|
Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs
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IEEE Transactions on Nuclear Science
| 65(8)
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1734--1741
|
August 2018
|
| pdf
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Academic Journal
|
R. Harada, Y. Mitsuyama, M. Hashimoto, T. Onoye
|
SET Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-Die Process Variation Effects
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IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences
| E97-A(7)
|
1461--1467
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July 2014
|
| 200.pdf
|
Academic Journal
|
H. Fuketa, R. Harada, M. Hashimoto, T. Onoye
|
Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10T Subthreshold SRAM
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IEEE Transactions on Device and Materials Reliability
| 14(1)
|
463 -- 470
|
March 2014
|
| 185.pdf
|
Academic Journal
|
R. Harada, Y. Mitsuyama, M. Hashimoto, T. Onoye
|
Impact of NBTI-Induced Pulse-Width Modulation on SET Pulse-Width Measurement
|
IEEE Transactions on Nuclear Science
| 60(4)
|
2630--2634
|
August 2013
|
| 180.pdf
|
Academic Journal
|
R. Harada, Y. Mitsuyama, M. Hashimoto, T. Onoye
|
Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-inverter-delay Resolution
|
IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences
| E93-A(12)
|
2417--2423
|
December 2010
|
| 149.pdf
|
Academic Journal
|
Y. Ogasahara, T. Enami, M. Hashimoto, T. Sato, T. Onoye
|
Validation of a Full-Chip Simulation Model for Supply Noise and Delay Dependence on Average Voltage Drop with On-Chip Delay Measurement
|
IEEE Transactions on Circuits and Systems II
| 54(10)
|
868--872
|
October 2007
|
| 94.pdf
|
International Conference
|
, , , , M. Fukuda, M. Hashimoto
|
Quasi Event-Wise Measurement of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs
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Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
(accepted, to appear)
|
|
|
International Conference
|
, , , , S. Abe, , M. Hashimoto
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In-Beam Activation Measurement of Muon Nuclear Capture Reaction on Si Isotopes
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The workshop on frontier nuclear studies with gamma-ray spectrometer arrays (gamma24)
|
|
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March 2024
|
|
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International Conference
|
, , , S. Abe, , M. Hashimoto
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Measurement of Muon-Induced Nuclear Transmutation for Si Isotopes
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Trans-scale Quantum Science Institute
|
|
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November 2022
|
|
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International Conference
|
, S. Manabe, Y. Watanabe, , W. Liao, M. Hashimoto, S. Abe, , , Y. Miyake
|
Measurement of Single-Event Upsets in 65-nm Bulk SRAMs under Irradiation of Spallation Neutrons at J-PARC MLF
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
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September 2019
|
|
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International Conference
|
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, Y. Miyake
|
Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk SRAMs
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
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October 2017
|
|
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International Conference
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R. Harada, S. Hirokawa, M. Hashimoto
|
Measurement of Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4 V SRAMs
|
IEEE Nuclear and Space Radiation Effects Conference (NSREC)
|
|
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July 2014
|
|
|
International Conference
|
R. Harada, Y. Mitsuyama, M. Hashimoto, T. Onoye
|
Impact of NBTI-Induced Pulse-Width Modulation on SET Pulse-Width Measurement
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
September 2012
|
|
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International Conference
|
R. Harada, Y. Mitsuyama, M. Hashimoto, T. Onoye
|
SET Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-Die Process Variation Effects
|
Proceedings of International Reliability Physics Symposium (IRPS)
|
|
|
April 2012
|
| 168.PDF
|
International Conference
|
D. Alnajjar, H. Kounoura, Y. Mitsuyama, M. Hashimoto, T. Onoye
|
MTTF Measurement under Alpha Particle Radiation in a Coarse-Grained Reconfigurable Architecture with Flexible Reliability
|
IEEE Workshop on Silicon Errors in Logic - System Effects (SELSE)
|
|
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March 2011
|
|
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International Conference
|
Y. Takai, Y. Ogasahara, M. Hashimoto, T. Onoye
|
Measurement of On-Chip I/O Power Supply Noise and Correlation Verification between Noise Magnitude and Delay Increase Due to SSO
|
Proceedings of IEEE Workshop on Signal Propagation on Interconnects (SPI)
|
|
19--20
|
May 2010
|
| 139.pdf
|
International Conference
|
R. Harada, Y. Mitsuyama, M. Hashimoto, T. Onoye
|
Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-inverter-delay Resolution
|
Proceedings of International Symposium on Quality Electronic Design (ISQED)
|
|
839--844
|
March 2010
|
| 138.pdf
|
International Conference
|
Y. Ogasahara, M. Hashimoto, T. Onoye
|
Dynamic Supply Noise Measurement Circuit Composed of Standard Cells Suitable for In-Site SoC Power Integrity Verification
|
Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC)
|
|
107--108
|
January 2008
|
| 97.pdf
|
International Conference
|
A. Shinmyo, M. Hashimoto, H. Onodera
|
Design and Measurement of 6.4 Gbps 8:1 Multiplexer in 0.18um CMOS Process
|
Proceedings of Asia and South Pacific Design Automation Conference (ASP-DAC)
|
|
D9-D10
|
January 2005
|
| 35.pdf
|
