この検索内の頻出タグ: 55-nm^:2 event-wise^:2 measurement^:2 125^:1 22-nm^:1 chip^:1 error^:1 errors^:1 every^:1 multiple-cell^:1 neutron-induced^:1 ns^:1 quasi^:1 scanning^:1 soft^:1 sram^:1 srams^:1 upsets^:1

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論文誌

[1] Y. Gomi, A. Sato, W. Madany, K. Okada, S. Adachi, M. Itoh, and M.Hashimoto, "A 55-nm SRAM Chip Scanning Errors Every 125 ns for Event-Wise Soft Error Measurement," IEEE Solid-State Circuits Letters, volume 8, pages 245-248, September 2025. [pdf]

国際会議

[1] Y. Gomi, K. Takami, R. Yasuda, H. Kanda, M. Fukuda, and M. Hashimoto, "Quasi Event-Wise Measurement of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), 採録済.