: Y. Gomi, K. Takami, K. Morita, and M. Hashimoto, Proton-Induced Distant MCU Analysis with Quasi Event-Wise Dynamic Measurement in 22-nm and 55-nm SRAMs, 採録済.
Detail of a work
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| Y. Gomi, K. Takami, K. Morita, and M. Hashimoto, "Proton-Induced Distant MCU Analysis with Quasi Event-Wise Dynamic Measurement in 22-nm and 55-nm SRAMs," Proceedings of International Reliability Physics Symposium (IRPS), 採録済. | |
| ID | 686 |
| 分類 | 国際会議 |
| タグ | 22-nm 55-nm analysis distant dynamic event-wise mcu measurement proton-induced quasi srams |
| 表題 (title) |
Proton-Induced Distant MCU Analysis with Quasi Event-Wise Dynamic Measurement in 22-nm and 55-nm SRAMs |
| 表題 (英文) |
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| 著者名 (author) |
Yuibi Gomi, Kazusa Takami, Koyo Morita, Masanori Hashimoto |
| 英文著者名 (author) |
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| キー (key) |
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| 定期刊行物名 (journal) |
Proceedings of International Reliability Physics Symposium (IRPS) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
0 |
| 出版年 (year) |
(to appear) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id686,
title = {Proton-Induced Distant {MCU} Analysis with Quasi Event-Wise Dynamic Measurement in {22-nm} and {55-nm} {SRAMs}},
author = {Yuibi Gomi and Kazusa Takami and Koyo Morita and Masanori Hashimoto},
journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
month = {0},
year = {(to appear)},
}
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