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この検索内の頻出タグ: 22-nm^:1 55-nm^:1 event-wise^:1 measurement^:1 multiple-cell^:1 neutron-induced^:1 quasi^:1 srams^:1 upsets^:1

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国際会議: [1] Y. Gomi, K. Takami, R. Yasuda, H. Kanda, M. Fukuda, and M. Hashimoto, "Quasi Event-Wise Measurement of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), 採録済.