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Y. Gomi, K. Takami, R. Yasuda, H. Kanda, M. Fukuda, and M. Hashimoto, "Quasi Event-Wise Measurement of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), 採録済.
ID 666
分類 国際会議
タグ 22-nm 55-nm event-wise measurement multiple-cell neutron-induced quasi srams upsets
表題 (title) Quasi Event-Wise Measurement of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs
表題 (英文)
著者名 (author) Y. Gomi,K. Takami,R. Yasuda,H. Kanda,M. Fukuda,M. Hashimoto
英文著者名 (author) ,,,,M. Fukuda,M. Hashimoto
キー (key) ,,,,M. Fukuda,M. Hashimoto
定期刊行物名 (journal) Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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刊行月 (month) 0
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BiBTeXエントリ
@article{id666,
         title = {Quasi Event-Wise Measurement of Neutron-Induced Multiple-Cell Upsets in {22-nm} and {55-nm} {SRAMs}},
        author = {Y. Gomi and K. Takami and R. Yasuda and H. Kanda and M. Fukuda and M. Hashimoto},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {0},
          year = {(to appear)},
}