この検索内の頻出タグ: 22-nm^:2 55-nm^:2 event-wise^:2 measurement^:2 quasi^:2 srams^:2 analysis^:1 distant^:1 dynamic^:1 mcu^:1 multiple-cell^:1 neutron-induced^:1 proton-induced^:1 upsets^:1

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国際会議

[1] Yuibi Gomi, Kazusa Takami, Koyo Morita, and Masanori Hashimoto, "Proton-Induced Distant MCU Analysis with Quasi Event-Wise Dynamic Measurement in 22-nm and 55-nm SRAMs," Proceedings of International Reliability Physics Symposium (IRPS), 採録済.

[2] Y. Gomi, K. Takami, R. Yasuda, H. Kanda, M. Fukuda, and M. Hashimoto, "Quasi Event-Wise Measurement of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2025.