この検索内の頻出タグ: bulk^:4 mcu^:4 seu^:4 neutron-induced^:3 sotb^:3 srams^:3 alpha-^:2 characterizing^:2 0.3v^:1 0.4^:1 0.4-v^:1 65^:1 analysis^:1 characterization^:1 dependence^:1 energetic^:1 influence^:1 low-energyneutron-induced^:1 measurement^:1 nm^:1 onestimation^:1 operation^:1 rate^:1 ser^:1 sram^:1 terrestrial^:1 v^:1

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論文誌

[1] W. Liao, K. Ito, S. Abe, Y. Mitsuyama, and M. Hashimoto, "Characterizing Energetic Dependence of Low-energy Neutron-induced SEU and MCU and Its Influence on Estimation of Terrestrial SER in 65 nm Bulk SRAM," IEEE Transactions on Nuclear Science, volume 68, number 6, pages 1228-1234, June 2021. [pdf]

[2] S. Hirokawa, R. Harada, M. Hashimoto, and T. Onoye, "Characterizing Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4-V SRAMs," IEEE Transactions on Nuclear Science, volume 62, number 2, pages 420--427, April 2015. [219.pdf]

国際会議

[1] S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, and Y. Watanabe, "Neutron-Induced SEU and MCU Rate Characterization and Analysis of SOTB and Bulk SRAMs at 0.3V Operation," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2015.

[2] R. Harada, S. Hirokawa, and M. Hashimoto, "Measurement of Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4 V SRAMs," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2014.