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この検索内の頻出タグ: 0.3v^:1 analysis^:1 bulk^:1 characterization^:1 mcu^:1 neutron-induced^:1 operation^:1 rate^:1 seu^:1 sotb^:1 srams^:1

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国際会議: [1] S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, and Y. Watanabe, "Neutron-Induced SEU and MCU Rate Characterization and Analysis of SOTB and Bulk SRAMs at 0.3V Operation," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2015.