Detail of a work
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S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, and Y. Watanabe, "Neutron-Induced SEU and MCU Rate Characterization and Analysis of SOTB and Bulk SRAMs at 0.3V Operation," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2015. | |
ID | 413 |
分類 | 国際会議 |
タグ | 0.3v analysis bulk characterization mcu neutron-induced operation rate seu sotb srams |
表題 (title) |
Neutron-Induced SEU and MCU Rate Characterization and Analysis of SOTB and Bulk SRAMs at 0.3V Operation |
表題 (英文) |
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著者名 (author) |
S. Hirokawa,R. Harada,M. Hashimoto,K. Sakuta,Y. Watanabe |
英文著者名 (author) |
S. Hirokawa,R. Harada,M. Hashimoto,K. Sakuta,Y. Watanabe |
キー (key) |
S. Hirokawa,R. Harada,M. Hashimoto,K. Sakuta,Y. Watanabe |
定期刊行物名 (journal) |
IEEE Nuclear and Space Radiation Effects Conference (NSREC) |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
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刊行月 (month) |
7 |
出版年 (year) |
2015 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 利用できません. |
BiBTeXエントリ |
@article{id413, title = {Neutron-Induced {SEU} and {MCU} Rate Characterization and Analysis of {SOTB} and Bulk {SRAMs} at {0.3V} Operation}, author = {S. Hirokawa and R. Harada and M. Hashimoto and K. Sakuta and Y. Watanabe}, journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)}, month = {7}, year = {2015}, } |