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S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, and Y. Watanabe, "Neutron-Induced SEU and MCU Rate Characterization and Analysis of SOTB and Bulk SRAMs at 0.3V Operation," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2015.
ID 413
分類 国際会議
タグ 0.3v analysis bulk characterization mcu neutron-induced operation rate seu sotb srams
表題 (title) Neutron-Induced SEU and MCU Rate Characterization and Analysis of SOTB and Bulk SRAMs at 0.3V Operation
表題 (英文)
著者名 (author) S. Hirokawa,R. Harada,M. Hashimoto,K. Sakuta,Y. Watanabe
英文著者名 (author) S. Hirokawa,R. Harada,M. Hashimoto,K. Sakuta,Y. Watanabe
キー (key) S. Hirokawa,R. Harada,M. Hashimoto,K. Sakuta,Y. Watanabe
定期刊行物名 (journal) IEEE Nuclear and Space Radiation Effects Conference (NSREC)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) 7
出版年 (year) 2015
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@article{id413,
         title = {Neutron-Induced {SEU} and {MCU} Rate Characterization and Analysis of {SOTB} and Bulk {SRAMs} at {0.3V} Operation},
        author = {S. Hirokawa and R. Harada and M. Hashimoto and K. Sakuta and Y. Watanabe},
       journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
         month = {7},
          year = {2015},
}