: S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, and Y. Watanabe, Neutron-Induced SEU and MCU Rate Characterization and Analysis of SOTB and Bulk SRAMs at 0.3V Operation, July 2015.
Detail of a work
| Tweet | |
| S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, and Y. Watanabe, "Neutron-Induced SEU and MCU Rate Characterization and Analysis of SOTB and Bulk SRAMs at 0.3V Operation," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2015. | |
| ID | 413 |
| 分類 | 国際会議 |
| タグ | 0.3v analysis bulk characterization mcu neutron-induced operation rate seu sotb srams |
| 表題 (title) |
Neutron-Induced SEU and MCU Rate Characterization and Analysis of SOTB and Bulk SRAMs at 0.3V Operation |
| 表題 (英文) |
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| 著者名 (author) |
S. Hirokawa,R. Harada,M. Hashimoto,K. Sakuta,Y. Watanabe |
| 英文著者名 (author) |
S. Hirokawa,R. Harada,M. Hashimoto,K. Sakuta,Y. Watanabe |
| キー (key) |
S. Hirokawa,R. Harada,M. Hashimoto,K. Sakuta,Y. Watanabe |
| 定期刊行物名 (journal) |
IEEE Nuclear and Space Radiation Effects Conference (NSREC) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
7 |
| 出版年 (year) |
2015 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id413,
title = {Neutron-Induced {SEU} and {MCU} Rate Characterization and Analysis of {SOTB} and Bulk {SRAMs} at {0.3V} Operation},
author = {S. Hirokawa and R. Harada and M. Hashimoto and K. Sakuta and Y. Watanabe},
journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
month = {7},
year = {2015},
}
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