Academic Journal
|
, Y. Watanabe, S. Manabe, W. Liao, M. Hashimoto, S. Abe, M. Tampo, Y. Miyake
|
Impact of Irradiation Side on Muon-Induced Single Event Upsets in 65-nm Bulk SRAMs
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IEEE Transactions on Nuclear Science
| 71(4)
|
912-920
|
April 2024
|
| pdf
|
Academic Journal
|
W. Liao, , S. Abe, Y. Mitsuyama, M. Hashimoto
|
Characterizing Energetic Dependence of Low-energy Neutron-induced SEU and MCU and Its Influence on Estimation of Terrestrial SER in 65 nm Bulk SRAM
|
IEEE Transactions on Nuclear Science
| 68(6)
|
1228-1234
|
June 2021
|
| pdf
|
Academic Journal
|
, S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto
|
Irradiation Test of 65 nm Bulk SRAMs with DC Muon Beam at RCNP MuSIC Facility
|
IEEE Transactions on Nuclear Science
| 67(7)
|
1555 -- 1559
|
July 2020
|
| pdf
|
Academic Journal
|
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, S. Abe, M. Tampo, , Y. Miyake
|
Impact of the Angle of Incidence on Negative Muon-Induced SEU Cross Sections of 65-nm Bulk and FDSOI SRAMs
|
IEEE Transactions on Nuclear Science
| 67(7)
|
1566 -- 1572
|
July 2020
|
| pdf
|
Academic Journal
|
S. Abe, W. Liao, S. Manabe, T. Sato, M. Hashimoto
|
Impact of Irradiation Side on Neutron-Induced Single Event Upsets in 65-nm Bulk SRAMs
|
IEEE Transactions on Nuclear Science
| 66(7)
|
1374 -- 1380
|
July 2019
|
| pdf
|
Academic Journal
|
W. Liao, M. Hashimoto, S. Manabe, S. Abe, Y. Watanabe
|
Similarity Analysis on Neutron- and Negative Moun-Induced MCUs in 65-nm Bulk SRAM
|
IEEE Transactions on Nuclear Science
| 66(7)
|
1390 -- 1397
|
July 2019
|
| pdf
|
Academic Journal
|
S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, S. Abe
|
Estimation of Muon-Induced SEU Rates for 65-nm Bulk and UTBB-SOI SRAMs
|
IEEE Transactions on Nuclear Science
| 66(7)
|
1398 -- 1403
|
July 2019
|
| pdf
|
Academic Journal
|
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, Y. Miyake
|
Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs
|
IEEE Transactions on Nuclear Science
| 65(8)
|
1734--1741
|
August 2018
|
| pdf
|
Academic Journal
|
S. Hirokawa, R. Harada, M. Hashimoto, T. Onoye
|
Characterizing Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4-V SRAMs
|
IEEE Transactions on Nuclear Science
| 62(2)
|
420--427
|
April 2015
|
| 219.pdf
|
International Conference
|
, T. Kato, M. Hashimoto
|
An SEU Cross Section Model Reproducing LET and Voltage Dependence in Bulk Planar and FinFET SRAMs
|
Proceedings of International Symposium on Reliability Physics (IRPS)
|
|
|
April 2024
|
| pdf
|
International Conference
|
W. Liao, , Y. Mitsuyama, M. Hashimoto
|
Characterizing Energetic Dependence of Low-Energy Neutron-Induced MCUs in 65 nm Bulk SRAMs
|
Proceedings of International Reliability Physics Symposium (IRPS)
|
|
|
April 2020
|
| pdf
|
International Conference
|
, S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto
|
Irradiation Test of 65-nm Bulk SRAMs with DC Muon Beam at RCNP-MuSIC Facility
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
September 2019
|
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|
International Conference
|
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, S. Abe, M. Tampo, , Y. Miyake
|
Impact of Incident Angle on Negative Muon-Induced SEU Cross Section of 65-nm Bulk SRAM
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
September 2019
|
|
|
International Conference
|
, S. Manabe, Y. Watanabe, , W. Liao, M. Hashimoto, S. Abe, , , Y. Miyake
|
Measurement of Single-Event Upsets in 65-nm Bulk SRAMs under Irradiation of Spallation Neutrons at J-PARC MLF
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Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
September 2019
|
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|
International Conference
|
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, S. Abe, M. Tampo, , Y. Miyake
|
Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs
|
Proceedings of International Reliability Physics Symposium (IRPS)
|
|
|
April 2019
|
| pdf
|
International Conference
|
M. Hashimoto, W. Liao, S. Manabe, Y. Watanabe
|
Characterizing Soft Error Rates of 65-nm SOTB and Bulk SRAMs with Muon and Neutron Beams (Invited)
|
Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
|
|
|
October 2018
|
| pdf
|
International Conference
|
S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, S. Abe
|
Estimation of Muon-Induced SEU Rates for 65-nm Bulk and UTBB-SOI SRAMs
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
September 2018
|
|
|
International Conference
|
W. Liao, M. Hashimoto, S. Manabe, S. Abe, Y. Watanabe
|
Similarity Analysis on Neutron- and Negative Moun-Induced MCUs in 65-nm Bulk SRAM
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
September 2018
|
|
|
International Conference
|
S. Abe, W. Liao, S. Manabe, T. Sato, M. Hashimoto, Y. Watanabe
|
Impact of Irradiation Side on Neutron-Induced Single Event Upsets in 65-nm Bulk SRAMs
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
September 2018
|
|
|
International Conference
|
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, Y. Miyake
|
Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk SRAMs
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
October 2017
|
|
|
International Conference
|
W. Liao, S. Hirokawa, R. Harada, M. Hashimoto
|
Contributions of SRAM, FF and Combinational Circuit to Chip-Level Neutron-Induced Soft Error Rate -- Bulk vs. FD-SOI at 0.5 and 1.0V --
|
Proceedings of International NEWCAS Conference
|
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33-37
|
June 2017
|
| pdf
|
International Conference
|
S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, Y. Watanabe
|
Neutron-Induced SEU and MCU Rate Characterization and Analysis of SOTB and Bulk SRAMs at 0.3V Operation
|
IEEE Nuclear and Space Radiation Effects Conference (NSREC)
|
|
|
July 2015
|
|
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International Conference
|
T. Uemura, S. Okano, T. Kato, H. Matsuyama, M. Hashimoto
|
Soft Error Immune Latch Design for 20 nm Bulk CMOS
|
Proceedings of International Reliability Physics Symposium (IRPS)
|
|
|
April 2015
|
| 217.pdf
|
International Conference
|
R. Harada, S. Hirokawa, M. Hashimoto
|
Measurement of Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4 V SRAMs
|
IEEE Nuclear and Space Radiation Effects Conference (NSREC)
|
|
|
July 2014
|
|
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International Conference
|
T. Uemura, T. Kato, H. Matsuyama, M. Hashimoto
|
Scaling Trend of SRAM and FF of Soft-Error Rate and Their Contribution to Processor Reliability on Bulk CMOS Technology
|
IEEE Nuclear and Space Radiation Effects Conference (NSREC)
|
|
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July 2013
|
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