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論文誌

[1] W. Liao, K. Ito, S. Abe, Y. Mitsuyama, and M. Hashimoto, "Characterizing Energetic Dependence of Low-energy Neutron-induced SEU and MCU and Its Influence on Estimation of Terrestrial SER in 65 nm Bulk SRAM," IEEE Transactions on Nuclear Science, volume 68, number 6, pages 1228-1234, June 2021. [pdf]

[2] Y. Ogasahara, T. Enami, M. Hashimoto, T. Sato, and T. Onoye, "Validation of a Full-Chip Simulation Model for Supply Noise and Delay Dependence on Average Voltage Drop with On-Chip Delay Measurement," IEEE Transactions on Circuits and Systems II, volume 54, number 10, pages 868--872, October 2007. [94.pdf]

国際会議

[1] K. Takeuchi, T. Kato, and M. Hashimoto, "An SEU Cross Section Model Reproducing LET and Voltage Dependence in Bulk Planar and FinFET SRAMs," Proceedings of International Symposium on Reliability Physics (IRPS), April 2024. [pdf]

[2] W. Liao, K. Ito, Y. Mitsuyama, and M. Hashimoto, "Characterizing Energetic Dependence of Low-Energy Neutron-Induced MCUs in 65 nm Bulk SRAMs," Proceedings of International Reliability Physics Symposium (IRPS), April 2020. [pdf]