: W. Liao, K. Ito, Y. Mitsuyama, and M. Hashimoto, Characterizing Energetic Dependence of Low-Energy Neutron-Induced MCUs in 65 nm Bulk SRAMs, April 2020.
Detail of a work
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| W. Liao, K. Ito, Y. Mitsuyama, and M. Hashimoto, "Characterizing Energetic Dependence of Low-Energy Neutron-Induced MCUs in 65 nm Bulk SRAMs," Proceedings of International Reliability Physics Symposium (IRPS), April 2020. | |
| ID | 539 |
| 分類 | 国際会議 |
| タグ | 65 bulk characterizing dependence energetic low-energy mcus neutron-induced nm srams |
| 表題 (title) |
Characterizing Energetic Dependence of Low-Energy Neutron-Induced MCUs in 65 nm Bulk SRAMs |
| 表題 (英文) |
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| 著者名 (author) |
W. Liao,K. Ito,Y. Mitsuyama,M. Hashimoto |
| 英文著者名 (author) |
W. Liao,,Y. Mitsuyama,M. Hashimoto |
| キー (key) |
W. Liao,,Y. Mitsuyama,M. Hashimoto |
| 定期刊行物名 (journal) |
Proceedings of International Reliability Physics Symposium (IRPS) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
4 |
| 出版年 (year) |
2020 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id539,
title = {Characterizing Energetic Dependence of Low-Energy Neutron-induced {MCUs} in 65 {nm} Bulk {SRAMs}},
author = {W. Liao and K. Ito and Y. Mitsuyama and M. Hashimoto},
journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
month = {4},
year = {2020},
}
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