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W. Liao, K. Ito, Y. Mitsuyama, and M. Hashimoto, "Characterizing Energetic Dependence of Low-Energy Neutron-Induced MCUs in 65 nm Bulk SRAMs," Proceedings of International Reliability Physics Symposium (IRPS), April 2020. | |
ID | 539 |
分類 | 国際会議 |
タグ | 65 bulk characterizing dependence energetic low-energy mcus neutron-induced nm srams |
表題 (title) |
Characterizing Energetic Dependence of Low-Energy Neutron-Induced MCUs in 65 nm Bulk SRAMs |
表題 (英文) |
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著者名 (author) |
W. Liao,K. Ito,Y. Mitsuyama,M. Hashimoto |
英文著者名 (author) |
W. Liao,,Y. Mitsuyama,M. Hashimoto |
キー (key) |
W. Liao,,Y. Mitsuyama,M. Hashimoto |
定期刊行物名 (journal) |
Proceedings of International Reliability Physics Symposium (IRPS) |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
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刊行月 (month) |
4 |
出版年 (year) |
2020 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id539, title = {Characterizing Energetic Dependence of Low-Energy Neutron-induced {MCUs} in 65 {nm} Bulk {SRAMs}}, author = {W. Liao and K. Ito and Y. Mitsuyama and M. Hashimoto}, journal = {Proceedings of International Reliability Physics Symposium (IRPS)}, month = {4}, year = {2020}, } |