List of works
この検索内の頻出タグ: nm:7 bulk:4 65:3 20:2 characterizing:2 cmos:2 dependence:2 energetic:2 sram:2 srams:2 128.4:1 22:1 28:1 292.2-to-321.4:1 beam:1 dbc:1 dc:1 design:1 error:1 event:1 facility:1 fsrms:1 generator:1 ghz:1 immune:1 impact:1 induced:1 influence:1 integrated:1 irradiation:1
- 論文誌
- [1] Y. Liang, S. Chen, H. Zhang, L. Lin, Q. Cheng, and M. Hashimoto, "A 292.2-To-321.4 GHz Synchronized Source Generator with ‒58.7 dBc Spurious Tone and 128.4 Fsrms Integrated Jitter in 22 nm CMOS Technology," IEEE Transactions on Microwave Theory and Techniques, 採録済.
- [2] W. Liao, K. Ito, S. Abe, Y. Mitsuyama, and M. Hashimoto, "Characterizing Energetic Dependence of Low-energy Neutron-induced SEU and MCU and Its Influence on Estimation of Terrestrial SER in 65 nm Bulk SRAM," IEEE Transactions on Nuclear Science, volume 68, number 6, pages 1228-1234, June 2021. [pdf]
- [3] T. Mahara, S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, T. Y. Saito, M. Niikura, K. Ninomiya, D. Tomono, and A. Sato, "Irradiation Test of 65 nm Bulk SRAMs with DC Muon Beam at RCNP MuSIC Facility," IEEE Transactions on Nuclear Science, volume 67, number 7, 1555 -- 1559, July 2020. [pdf]
- [4] T. Uemura, T. Kato, H. Matsuyama, and M. Hashimoto, "Mitigating Multi-Bit-Upset with Well-Slits in 28 nm Multi-Bit-Latch," IEEE Transactions on Nuclear Science, volume 60, number 6, pages 4362--4367, December 2013. [197.pdf]
- 国際会議
- [1] W. Liao, K. Ito, Y. Mitsuyama, and M. Hashimoto, "Characterizing Energetic Dependence of Low-Energy Neutron-Induced MCUs in 65 nm Bulk SRAMs," Proceedings of International Reliability Physics Symposium (IRPS), April 2020. [pdf]
- [2] T. Uemura, T. Kato, S. Okano, H. Matsuyama, and M. Hashimoto, "Impact of Package on Neutron Induced Single Event Upset in 20 nm SRAM," Proceedings of International Symposium on Reliability Physics (IRPS), April 2015. [215.pdf]
- [3] T. Uemura, S. Okano, T. Kato, H. Matsuyama, and M. Hashimoto, "Soft Error Immune Latch Design for 20 nm Bulk CMOS," Proceedings of International Reliability Physics Symposium (IRPS), April 2015. [217.pdf]