: T. Uemura, S. Okano, T. Kato, H. Matsuyama, and M. Hashimoto, Soft Error Immune Latch Design for 20 nm Bulk CMOS, April 2015.
Detail of a work
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| T. Uemura, S. Okano, T. Kato, H. Matsuyama, and M. Hashimoto, "Soft Error Immune Latch Design for 20 nm Bulk CMOS," Proceedings of International Reliability Physics Symposium (IRPS), April 2015. | |
| ID | 402 |
| 分類 | 国際会議 |
| タグ | 20 bulk cmos design error immune latch nm soft |
| 表題 (title) |
Soft Error Immune Latch Design for 20 nm Bulk CMOS |
| 表題 (英文) |
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| 著者名 (author) |
T. Uemura,S. Okano,T. Kato,H. Matsuyama,M. Hashimoto |
| 英文著者名 (author) |
T. Uemura,S. Okano,T. Kato,H. Matsuyama,M. Hashimoto |
| キー (key) |
T. Uemura,S. Okano,T. Kato,H. Matsuyama,M. Hashimoto |
| 定期刊行物名 (journal) |
Proceedings of International Reliability Physics Symposium (IRPS) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
4 |
| 出版年 (year) |
2015 |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 217.pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id402,
title = {Soft Error Immune Latch Design for 20 {nm} bulk {CMOS}},
author = {T. Uemura and S. Okano and T. Kato and H. Matsuyama and M. Hashimoto},
journal = {Proceedings of International Reliability Physics Symposium (IRPS)},
month = {4},
year = {2015},
}
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