Detail of a work
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T. Uemura, T. Kato, S. Okano, H. Matsuyama, and M. Hashimoto, "Impact of Package on Neutron Induced Single Event Upset in 20 nm SRAM," Proceedings of International Symposium on Reliability Physics (IRPS), April 2015. | |
ID | 400 |
分類 | 国際会議 |
タグ | 20 event impact induced neutron nm package single sram upset |
表題 (title) |
Impact of Package on Neutron Induced Single Event Upset in 20 nm SRAM |
表題 (英文) |
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著者名 (author) |
T. Uemura,T. Kato,S. Okano,H. Matsuyama,M. Hashimoto |
英文著者名 (author) |
T. Uemura,T. Kato,S. Okano,H. Matsuyama,M. Hashimoto |
キー (key) |
T. Uemura,T. Kato,S. Okano,H. Matsuyama,M. Hashimoto |
定期刊行物名 (journal) |
Proceedings of International Symposium on Reliability Physics (IRPS) |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
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刊行月 (month) |
4 |
出版年 (year) |
2015 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 215.pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id400, title = {Impact of Package on Neutron Induced Single Event Upset in 20 {nm} {SRAM}}, author = {T. Uemura and T. Kato and S. Okano and H. Matsuyama and M. Hashimoto}, journal = {Proceedings of International Symposium on Reliability Physics (IRPS)}, month = {4}, year = {2015}, } |