Academic Journal
|
, , , , , , , Y. Watanabe, S. Abe, W. Liao, M. Tampo, , , Y. Miyake, M. Hashimoto
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Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs, and 28-nm Planar SRAMs and Register Files
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IEEE Transactions on Nuclear Science
|
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(accepted, to appear)
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|
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Academic Journal
|
, , , S. Abe, , , M. Fukuda, M. Hashimoto
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Validating Terrestrial SER in 12-, 28- and 65-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation
|
IEEE Transactions on Nuclear Science
| 72(8)
|
2622-2628
|
August 2025
|
| pdf
|
Academic Journal
|
, Y. Watanabe, S. Manabe, W. Liao, M. Hashimoto, S. Abe, M. Tampo, Y. Miyake
|
Impact of Irradiation Side on Muon-Induced Single Event Upsets in 65-nm Bulk SRAMs
|
IEEE Transactions on Nuclear Science
| 71(4)
|
912-920
|
April 2024
|
| pdf
|
Academic Journal
|
T. Kato, M. Tampo, , , H. Matsuyama, M. Hashimoto, Y. Miyake
|
Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles
|
IEEE Transactions on Nuclear Science
| 68(7)
|
1436-1444
|
July 2021
|
| pdf
|
Academic Journal
|
, S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto
|
Irradiation Test of 65 nm Bulk SRAMs with DC Muon Beam at RCNP MuSIC Facility
|
IEEE Transactions on Nuclear Science
| 67(7)
|
1555 -- 1559
|
July 2020
|
| pdf
|
Academic Journal
|
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, S. Abe, M. Tampo, , Y. Miyake
|
Impact of the Angle of Incidence on Negative Muon-Induced SEU Cross Sections of 65-nm Bulk and FDSOI SRAMs
|
IEEE Transactions on Nuclear Science
| 67(7)
|
1566 -- 1572
|
July 2020
|
| pdf
|
Academic Journal
|
, S. Manabe, Y. Watanabe, , W. Liao, M. Hashimoto, S. Abe, , , Y. Miyake
|
Measurement of Single-Event Upsets in 65-nm SRAMs under Irradiation of Spallation Neutrons at J-PARC MLF
|
IEEE Transactions on Nuclear Science
| 67(7)
|
1599 -- 1605
|
July 2020
|
| pdf
|
Academic Journal
|
T. Kato, M. Hashimoto, H. Matsuyama
|
Angular Sensitivity of Neutron-Induced Single-Event Upsets in 12-nm FinFET SRAMs with Comparison to 20-nm Planar SRAMs
|
IEEE Transactions on Nuclear Science
| 67(7)
|
1485 -- 1493
|
July 2020
|
| pdf
|
Academic Journal
|
S. Abe, W. Liao, S. Manabe, T. Sato, M. Hashimoto
|
Impact of Irradiation Side on Neutron-Induced Single Event Upsets in 65-nm Bulk SRAMs
|
IEEE Transactions on Nuclear Science
| 66(7)
|
1374 -- 1380
|
July 2019
|
| pdf
|
Academic Journal
|
S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, S. Abe
|
Estimation of Muon-Induced SEU Rates for 65-nm Bulk and UTBB-SOI SRAMs
|
IEEE Transactions on Nuclear Science
| 66(7)
|
1398 -- 1403
|
July 2019
|
| pdf
|
Academic Journal
|
S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, K. Nakano, H. Sato, T. Kin, S. Abe, K. Hamada, M. Tampo, Y. Miyake
|
Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs
|
IEEE Transactions on Nuclear Science
| 65(8)
|
1742--1749
|
August 2018
|
| pdf
|
Academic Journal
|
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, Y. Miyake
|
Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs
|
IEEE Transactions on Nuclear Science
| 65(8)
|
1734--1741
|
August 2018
|
| pdf
|
Academic Journal
|
S. Hirokawa, R. Harada, M. Hashimoto, T. Onoye
|
Characterizing Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4-V SRAMs
|
IEEE Transactions on Nuclear Science
| 62(2)
|
420--427
|
April 2015
|
| 219.pdf
|
International Conference
|
, , , , M. Fukuda, M. Hashimoto
|
Quasi Event-Wise Measurement of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs
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Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
(accepted, to appear)
|
|
|
International Conference
|
M. Hashimoto
|
Characterization and Understanding of Cosmic Ray-Induced Soft Errors in SRAMs
|
Proceedings of International Meeting for Future of Electron Devices, Kansai
|
|
|
November 2024
|
| pdf
|
International Conference
|
|
Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
September 2024
|
|
|
International Conference
|
|
Validating Terrestrial SER in 12- and 28-nm SRAMs Estimated by Simulation Coupled with One-Time Neutron Irradiation
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
September 2024
|
|
|
International Conference
|
, T. Kato, M. Hashimoto
|
An SEU Cross Section Model Reproducing LET and Voltage Dependence in Bulk Planar and FinFET SRAMs
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Proceedings of International Symposium on Reliability Physics (IRPS)
|
|
|
April 2024
|
| pdf
|
International Conference
|
, , , , , , Y. Watanabe, S. Abe, W. Liao, M. Tampo, , , , Y. Miyake, M. Hashimoto
|
Muon-Induced SEU Cross Sections of 12-nm FinFET and 28-nm Planar SRAMs
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
September 2023
|
|
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International Conference
|
, , S. Abe, W. Liao, S. Manabe, , M. Hashimoto
|
Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons
|
Proceedings of International Reliability Physics Symposium (IRPS)
|
|
|
March 2023
|
| pdf
|
International Conference
|
T. Kato, M. Tampo, , Y. Miyake, , M. Hashimoto
|
Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha-Particles
|
IEEE Nuclear and Space Radiation Effects Conference (NSREC)
|
|
|
November 2020
|
|
|
International Conference
|
W. Liao, , Y. Mitsuyama, M. Hashimoto
|
Characterizing Energetic Dependence of Low-Energy Neutron-Induced MCUs in 65 nm Bulk SRAMs
|
Proceedings of International Reliability Physics Symposium (IRPS)
|
|
|
April 2020
|
| pdf
|
International Conference
|
, S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto
|
Irradiation Test of 65-nm Bulk SRAMs with DC Muon Beam at RCNP-MuSIC Facility
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
September 2019
|
|
|
International Conference
|
, S. Manabe, Y. Watanabe, , W. Liao, M. Hashimoto, S. Abe, , , Y. Miyake
|
Measurement of Single-Event Upsets in 65-nm Bulk SRAMs under Irradiation of Spallation Neutrons at J-PARC MLF
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
September 2019
|
|
|
International Conference
|
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, S. Abe, M. Tampo, , Y. Miyake
|
Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs
|
Proceedings of International Reliability Physics Symposium (IRPS)
|
|
|
April 2019
|
| pdf
|
International Conference
|
M. Hashimoto, W. Liao, S. Manabe, Y. Watanabe
|
Characterizing Soft Error Rates of 65-nm SOTB and Bulk SRAMs with Muon and Neutron Beams (Invited)
|
Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
|
|
|
October 2018
|
| pdf
|
International Conference
|
S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, S. Abe
|
Estimation of Muon-Induced SEU Rates for 65-nm Bulk and UTBB-SOI SRAMs
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
September 2018
|
|
|
International Conference
|
S. Abe, W. Liao, S. Manabe, T. Sato, M. Hashimoto, Y. Watanabe
|
Impact of Irradiation Side on Neutron-Induced Single Event Upsets in 65-nm Bulk SRAMs
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
September 2018
|
|
|
International Conference
|
W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, Y. Miyake
|
Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk SRAMs
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
October 2017
|
|
|
International Conference
|
S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, Y. Miyake
|
Momentum and Supply Voltage Dependencies of SEUs Induced by Low-Energy Negative and Positive Muons in 65-nm UTBB-SOI SRAMs
|
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
|
|
|
October 2017
|
|
|
International Conference
|
S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, Y. Watanabe
|
Neutron-Induced SEU and MCU Rate Characterization and Analysis of SOTB and Bulk SRAMs at 0.3V Operation
|
IEEE Nuclear and Space Radiation Effects Conference (NSREC)
|
|
|
July 2015
|
|
|
International Conference
|
R. Harada, S. Hirokawa, M. Hashimoto
|
Measurement of Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4 V SRAMs
|
IEEE Nuclear and Space Radiation Effects Conference (NSREC)
|
|
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July 2014
|
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