: Y. Gomi, K. Takami, R. Mizuno, M. Niikura, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, I. Umegaki, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, Muon-Induced SEU Cross Sections of 12-nm FinFET and 28-nm Planar SRAMs, September 2023.
Detail of a work
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| Y. Gomi, K. Takami, R. Mizuno, M. Niikura, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, I. Umegaki, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, "Muon-Induced SEU Cross Sections of 12-nm FinFET and 28-nm Planar SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2023. | |
| ID | 618 |
| 分類 | 国際会議 |
| タグ | 12-nm 28-nm cross finfet muon-induced planar sections seu srams |
| 表題 (title) |
Muon-Induced SEU Cross Sections of 12-nm FinFET and 28-nm Planar SRAMs |
| 表題 (英文) |
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| 著者名 (author) |
Y. Gomi,K. Takami,R. Mizuno,M. Niikura,Y. Deng,S. Kawase,Y. Watanabe,S. Abe,W. Liao,M. Tampo,I. Umegaki,S. Takeshita,K. Shimomura,Y. Miyake,M. Hashimoto |
| 英文著者名 (author) |
,,,,,,Y. Watanabe,S. Abe,W. Liao,M. Tampo,,,,Y. Miyake,M. Hashimoto |
| キー (key) |
,,,,,,Y. Watanabe,S. Abe,W. Liao,M. Tampo,,,,Y. Miyake,M. Hashimoto |
| 定期刊行物名 (journal) |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
9 |
| 出版年 (year) |
2023 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id618,
title = {Muon-Induced {SEU} Cross Sections of {12-nm} {FinFET} and {28-nm} Planar {SRAMs}},
author = {Y. Gomi and K. Takami and R. Mizuno and M. Niikura and Y. Deng and S. Kawase and Y. Watanabe and S. Abe and W. Liao and M. Tampo and I. Umegaki and S. Takeshita and K. Shimomura and Y. Miyake and M. Hashimoto},
journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
month = {9},
year = {2023},
}
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