: T. Kato, M. Tampo, S. Takeshita, Y. Miyake, H. Tanaka, and M. Hashimoto, Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha-Particles, November 2020.
Detail of a work
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| T. Kato, M. Tampo, S. Takeshita, Y. Miyake, H. Tanaka, and M. Hashimoto, "Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha-Particles," IEEE Nuclear and Space Radiation Effects Conference (NSREC), November 2020. | |
| ID | 545 |
| 分類 | 国際会議 |
| タグ | 20-nm alpha-particles characterization comparative muon-induced neutrons single-event srams upsets |
| 表題 (title) |
Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha-Particles |
| 表題 (英文) |
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| 著者名 (author) |
T. Kato,M. Tampo,S. Takeshita,Y. Miyake,H Tanaka,M. Hashimoto |
| 英文著者名 (author) |
T. Kato,M. Tampo,,Y. Miyake,,M. Hashimoto |
| キー (key) |
T. Kato,M. Tampo,,Y. Miyake,,M. Hashimoto |
| 定期刊行物名 (journal) |
IEEE Nuclear and Space Radiation Effects Conference (NSREC) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
11 |
| 出版年 (year) |
2020 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id545,
title = {Muon-Induced Single-Event Upsets in {20-nm} {SRAMs:} Comparative Characterization with Neutrons and {Alpha-Particles}},
author = {T. Kato and M. Tampo and S. Takeshita and Y. Miyake and H Tanaka and M. Hashimoto},
journal = {IEEE Nuclear and Space Radiation Effects Conference (NSREC)},
month = {11},
year = {2020},
}
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