論文誌
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T. Mahara, S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, T. Y. Saito, M. Niikura, K. Ninomiya, D. Tomono, A. Sato
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Irradiation Test of 65 nm Bulk SRAMs with DC Muon Beam at RCNP MuSIC Facility
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IEEE Transactions on Nuclear Science
| 67(7)
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1555 -- 1559
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2020年7月
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| pdf
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国際会議
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R. Mizuno, M. Niikura, T. Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, I. Umegaki, A. Hillier, T. Kawata, K. Kitafuji, Y. Yamaguchi, D. Tomono, F. Minato
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In-Beam Activation Measurement of Muon Nuclear Capture Reaction on Si Isotopes
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The workshop on frontier nuclear studies with gamma-ray spectrometer arrays (gamma24)
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2024年3月
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国際会議
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R. Mizuno, M. Niikura, T. Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, I. Umegaki, A. Hillier, T. Kawata, K. Kitafuji, Y. Yamaguchi, D. Tomono, F. Minato
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Muon Nuclear Capture Reaction on 28,29,30si
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2023 Fall meeting of APS DNP and JPS
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2023年11月
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国際会議
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R. Mizuno, M. Niikura, T. Y. Saito, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, T. Matsuzaki, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, I. Umegaki
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Study of Muon Capture Reaction on Si Via In-Beam Muon Activation
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Advances in Radioactive Isotope Science (ARIS)
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2023年6月
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国際会議
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R. Mizuno, M. Niikura, T. Y. Saito, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, T. Matsuzaki, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, I. Umegaki
|
Study of Muon Capture Reaction on Si Via In-Beam Muon Activation
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Topical Workshops on Modern Aspects of Nuclear Structure
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2023年2月
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国際会議
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T. Mahara, S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, T. Y. Saito, M. Niikura, K. Ninomiya, D. Tomono, A. Sato
|
Irradiation Test of 65-nm Bulk SRAMs with DC Muon Beam at RCNP-MuSIC Facility
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Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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2019年9月
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国際会議
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M. Hashimoto, W. Liao, S. Manabe, Y. Watanabe
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Characterizing Soft Error Rates of 65-nm SOTB and Bulk SRAMs with Muon and Neutron Beams (Invited)
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Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
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2018年10月
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| pdf
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国際会議
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W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, Y. Miyake
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Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk SRAMs
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Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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2017年10月
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