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論文誌

[1] T. Mahara, S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, T. Y. Saito, M. Niikura, K. Ninomiya, D. Tomono, and A. Sato, "Irradiation Test of 65 nm Bulk SRAMs with DC Muon Beam at RCNP MuSIC Facility," IEEE Transactions on Nuclear Science, volume 67, number 7, 1555 -- 1559, July 2020. [pdf]

国際会議

[1] R. Mizuno, M. Niikura, T. Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, I. Umegaki, A. Hillier, T. Kawata, K. Kitafuji, Y. Yamaguchi, D. Tomono, and F. Minato, "In-Beam Activation Measurement of Muon Nuclear Capture Reaction on Si Isotopes," The workshop on frontier nuclear studies with gamma-ray spectrometer arrays (gamma24), March 2024.

[2] R. Mizuno, M. Niikura, T. Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, I. Umegaki, A. Hillier, T. Kawata, K. Kitafuji, Y. Yamaguchi, D. Tomono, and F. Minato, "Muon Nuclear Capture Reaction on 28,29,30si," 2023 Fall meeting of APS DNP and JPS, November 2023.

[3] R. Mizuno, M. Niikura, T. Y. Saito, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, T. Matsuzaki, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, and I. Umegaki, "Study of Muon Capture Reaction on Si Via In-Beam Muon Activation," Advances in Radioactive Isotope Science (ARIS), June 2023.

[4] R. Mizuno, M. Niikura, T. Y. Saito, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, T. Matsuzaki, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, and I. Umegaki, "Study of Muon Capture Reaction on Si Via In-Beam Muon Activation," Topical Workshops on Modern Aspects of Nuclear Structure, February 2023.

[5] T. Mahara, S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, T. Y. Saito, M. Niikura, K. Ninomiya, D. Tomono, and A. Sato, "Irradiation Test of 65-nm Bulk SRAMs with DC Muon Beam at RCNP-MuSIC Facility," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2019.

[6] M. Hashimoto, W. Liao, S. Manabe, and Y. Watanabe, "Characterizing Soft Error Rates of 65-nm SOTB and Bulk SRAMs with Muon and Neutron Beams (Invited)," Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), October 2018. [pdf]

[7] W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, and Y. Miyake, "Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2017.