List of works
この検索内の頻出タグ: study:7 capture:4 muon:4 activation:2 branching:2 excited:2 in-beam:2 measurement:2 nuclear:2 populated:2 production:2 ratio:2 reaction:2 si:2 states:2 via:2 accurately:1 ai:1 be:1 black-box/white-box:1 can:1 case:1 cases?:1 circuit/instance/transistor-level:1 comparative:1 consideration:1 ddr5:1 degrading:1 delay:1 due:1
- 論文誌
- [1] Y. Li, M. Yoshida, Y. Gomi, Y. Deng, Y. Watanabe, S. Adachi, M. Itoh, G. Zhang, C. He, and M. Hashimoto, "Experimental Study of Proton-Induced Radiation Effects on DDR5 Modules," IEEE Transactions on Nuclear Science, volume 72, number 6, pages 1907-1918, June 2025. [pdf]
- 国際会議
- [1] R. Mizuno, M. Niikura, T.Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, A. D. Hillier, K. Ishida, N. Kawamura, S. Kawase, T. Kawata, K. Kitafuji, F. Minato, M. Oishi, A. Sato, K. Shimomura, P. Strasser, S. Takeshita, D. Tomono, and Y. Watanabe, "Study of Excited States Populated by Muon Nuclear Capture Based on the Production Branching Ratio Measurement," The 8th international workshop on Compound-Nuclear Reactions and Related Topics (CNR*26), 採録済.
- [2] R. Mizuno, M. Niikura, T.Y. Saito, T. Matsuzaki, S. Abe, H. Fukuda, M. Hashimoto, A. D. Hillier, K. Ishida, N. Kawamura, S. Kawase, T. Kawata, K. Kitafuji, F. Minato, M. Oishi, A. Sato, K. Shimomura, P. Strasser, S. Takeshita, D. Tomono, and Y. Watanabe, "Study of Excited States Populated by Muon Nuclear Capture Based on the Production Branching Ratio Measurement," The 5th Conference on Advances in Radioactive Isotope Science (ARIS2026), February 2026.
- [3] Q. Cheng, Q. Li, L. Lin, W. Liao, L. Dai, H. Yu, and M. Hashimoto, "How Accurately Can Soft Error Impact Be Estimated in Black-Box/White-Box Cases? -- a Case Study with an Edge AI SoC --," Proceedings of Design Automation Conference (DAC), June 2024. [pdf]
- [4] R. Mizuno, M. Niikura, T. Y. Saito, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, T. Matsuzaki, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, and I. Umegaki, "Study of Muon Capture Reaction on Si Via In-Beam Muon Activation," Advances in Radioactive Isotope Science (ARIS), June 2023.
- [5] R. Mizuno, M. Niikura, T. Y. Saito, S. Abe, H. Fukuda, M. Hashimoto, K. Ishida, N. Kawamura, S. Kawase, T. Matsuzaki, M. Oishi, P. Strasser, A. Sato, K. Shimomura, S. Takeshita, and I. Umegaki, "Study of Muon Capture Reaction on Si Via In-Beam Muon Activation," Topical Workshops on Modern Aspects of Nuclear Structure, February 2023.
- [6] H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Comparative Study on Delay Degrading Estimation Due to NBTI with Circuit/Instance/Transistor-Level Stress Probability Consideration," Proceedings of International Symposium on Quality Electronic Design (ISQED), pages 646--651, March 2010. [137.pdf]