この検索内の頻出タグ: comparative^:3 20-nm^:2 characterization^:2 muon-induced^:2 neutrons^:2 single-event^:2 srams^:2 upsets^:2 alpha^:1 alpha-particles^:1 circuit/instance/transistor-level^:1 consideration^:1 degrading^:1 delay^:1 due^:1 estimation^:1 nbti^:1 particles^:1 probability^:1 stress^:1 study^:1

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論文誌

[1] T. Kato, M. Tampo, S. Takeshita, H. Tanaka, H. Matsuyama, M. Hashimoto, and Y. Miyake, "Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles," IEEE Transactions on Nuclear Science, volume 68, number 7, pages 1436-1444, July 2021. [pdf]

国際会議

[1] T. Kato, M. Tampo, S. Takeshita, Y. Miyake, H Tanaka, and M. Hashimoto, "Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha-Particles," IEEE Nuclear and Space Radiation Effects Conference (NSREC), November 2020.

[2] H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Comparative Study on Delay Degrading Estimation Due to NBTI with Circuit/Instance/Transistor-Level Stress Probability Consideration," Proceedings of International Symposium on Quality Electronic Design (ISQED), pages 646--651, March 2010. [137.pdf]