Detail of a work
Tweet | |
H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Comparative Study on Delay Degrading Estimation Due to NBTI with Circuit/Instance/Transistor-Level Stress Probability Consideration," Proceedings of International Symposium on Quality Electronic Design (ISQED), pp. 646--651, March 2010. | |
ID | 258 |
分類 | 国際会議 |
タグ | circuit/instance/transistor-level comparative consideration degrading delay due estimation nbti probability stress study |
表題 (title) |
Comparative Study on Delay Degrading Estimation Due to NBTI with Circuit/Instance/Transistor-Level Stress Probability Consideration |
表題 (英文) |
|
著者名 (author) |
H. Konoura,Y. Mitsuyama,M. Hashimoto,T. Onoye |
英文著者名 (author) |
H. Konoura,Y. Mitsuyama,M. Hashimoto,T. Onoye |
キー (key) |
H. Konoura,Y. Mitsuyama,M. Hashimoto,T. Onoye |
定期刊行物名 (journal) |
Proceedings of International Symposium on Quality Electronic Design (ISQED) |
定期刊行物名 (英文) |
|
巻数 (volume) |
|
号数 (number) |
|
ページ範囲 (pages) |
646--651 |
刊行月 (month) |
3 |
出版年 (year) |
2010 |
Impact Factor (JCR) |
|
URL |
|
付加情報 (note) |
|
注釈 (annote) |
|
内容梗概 (abstract) |
|
論文電子ファイル | 137.pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id258, title = {Comparative study on delay degrading estimation due to {NBTI} with circuit/instance/transistor-level stress probability consideration}, author = {H. Konoura and Y. Mitsuyama and M. Hashimoto and T. Onoye}, journal = {Proceedings of International Symposium on Quality Electronic Design (ISQED)}, pages = {646--651}, month = {3}, year = {2010}, } |