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H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Comparative Study on Delay Degrading Estimation Due to NBTI with Circuit/Instance/Transistor-Level Stress Probability Consideration," Proceedings of International Symposium on Quality Electronic Design (ISQED), pp. 646--651, March 2010.
ID 258
分類 国際会議
タグ circuit/instance/transistor-level comparative consideration degrading delay due estimation nbti probability stress study
表題 (title) Comparative Study on Delay Degrading Estimation Due to NBTI with Circuit/Instance/Transistor-Level Stress Probability Consideration
表題 (英文)
著者名 (author) H. Konoura,Y. Mitsuyama,M. Hashimoto,T. Onoye
英文著者名 (author) H. Konoura,Y. Mitsuyama,M. Hashimoto,T. Onoye
キー (key) H. Konoura,Y. Mitsuyama,M. Hashimoto,T. Onoye
定期刊行物名 (journal) Proceedings of International Symposium on Quality Electronic Design (ISQED)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages) 646--651
刊行月 (month) 3
出版年 (year) 2010
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル 137.pdf (application/pdf) [一般閲覧可]
BiBTeXエントリ
@article{id258,
         title = {Comparative study on delay degrading estimation due to {NBTI} with circuit/instance/transistor-level stress probability consideration},
        author = {H. Konoura and Y. Mitsuyama and M. Hashimoto and T. Onoye},
       journal = {Proceedings of International Symposium on Quality Electronic Design (ISQED)},
         pages = {646--651},
         month = {3},
          year = {2010},
}