: H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, Comparative Study on Delay Degrading Estimation Due to NBTI with Circuit/Instance/Transistor-Level Stress Probability Consideration, March 2010.
Detail of a work
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| H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Comparative Study on Delay Degrading Estimation Due to NBTI with Circuit/Instance/Transistor-Level Stress Probability Consideration," Proceedings of International Symposium on Quality Electronic Design (ISQED), pp. 646--651, March 2010. | |
| ID | 258 |
| 分類 | 国際会議 |
| タグ | circuit/instance/transistor-level comparative consideration degrading delay due estimation nbti probability stress study |
| 表題 (title) |
Comparative Study on Delay Degrading Estimation Due to NBTI with Circuit/Instance/Transistor-Level Stress Probability Consideration |
| 表題 (英文) |
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| 著者名 (author) |
H. Konoura,Y. Mitsuyama,M. Hashimoto,T. Onoye |
| 英文著者名 (author) |
H. Konoura,Y. Mitsuyama,M. Hashimoto,T. Onoye |
| キー (key) |
H. Konoura,Y. Mitsuyama,M. Hashimoto,T. Onoye |
| 定期刊行物名 (journal) |
Proceedings of International Symposium on Quality Electronic Design (ISQED) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
646--651 |
| 刊行月 (month) |
3 |
| 出版年 (year) |
2010 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 137.pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id258,
title = {Comparative study on delay degrading estimation due to {NBTI} with circuit/instance/transistor-level stress probability consideration},
author = {H. Konoura and Y. Mitsuyama and M. Hashimoto and T. Onoye},
journal = {Proceedings of International Symposium on Quality Electronic Design (ISQED)},
pages = {646--651},
month = {3},
year = {2010},
}
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