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論文誌

[1] H. Konoura, T. Kameda, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "NBTI Mitigation Method by Inputting Random Scan-In Vectors in Standby Time," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E97-A, number 7, pages 1483--1491, July 2014. [202.pdf]

国際会議

[1] R. Harada, M. Hashimoto, and T. Onoye, "NBTI Characterization Using Pulse-Width Modulation," IEEE/ACM Workshop on Variability Modeling and Characterization, November 2013.

[2] T. Kameda, H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "NBTI Mitigation by Giving Random Scan-In Vectors During Standby Mode," Proceedings of International Workshop on Power And Timing Modeling, Optimization and Simulation (PATMOS), pages 152--161, September 2011.

[3] H. Konoura, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Comparative Study on Delay Degrading Estimation Due to NBTI with Circuit/Instance/Transistor-Level Stress Probability Consideration," Proceedings of International Symposium on Quality Electronic Design (ISQED), pages 646--651, March 2010. [137.pdf]