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16 件の該当がありました. : このページのURL : HTML


論文誌
[1] S. Hirokawa, R. Harada, M. Hashimoto, and T. Onoye, "Characterizing Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4-V SRAMs," IEEE Transactions on Nuclear Science, volume 62, number 2, pages 420--427, April 2015. [219.pdf]
[2] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "SET Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-Die Process Variation Effects," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E97-A, number 7, pages 1461--1467, July 2014. [200.pdf]
[3] H. Fuketa, R. Harada, M. Hashimoto, and T. Onoye, "Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10T Subthreshold SRAM," IEEE Transactions on Device and Materials Reliability, volume 14, number 1, 463 -- 470, March 2014. [185.pdf]
[4] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Impact of NBTI-Induced Pulse-Width Modulation on SET Pulse-Width Measurement," IEEE Transactions on Nuclear Science, volume 60, number 4, pages 2630--2634, August 2013. [180.pdf]
[5] R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, and Y. Watanabe, "Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM," IEEE Transactions on Nuclear Science, volume 59, number 6, pages 2791--2795, December 2012. [175.pdf]
[6] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-inverter-delay Resolution," IEICE Trans. on Fundamentals of Electronics, Communications and Computer Sciences, volume E93-A, number 12, pages 2417--2423, December 2010. [149.pdf]
国際会議
[1] W. Liao, S. Hirokawa, R. Harada, and M. Hashimoto, "Contributions of SRAM, FF and Combinational Circuit to Chip-Level Neutron-Induced Soft Error Rate -- Bulk vs. FD-SOI at 0.5 and 1.0V --," Proceedings of International NEWCAS Conference, pages 33-37, June 2017. [pdf]
[2] S. Hirokawa, R. Harada, K. Sakuta, Y. Watanabe, and M. Hashimoto, "Multiple Sensitive Volume Based Soft Error Rate Estimation with Machine Learning," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2016. [pdf]
[3] S. Hirokawa, R. Harada, M. Hashimoto, K. Sakuta, and Y. Watanabe, "Neutron-Induced SEU and MCU Rate Characterization and Analysis of SOTB and Bulk SRAMs at 0.3V Operation," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2015.
[4] R. Harada, S. Hirokawa, and M. Hashimoto, "Measurement of Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4 V SRAMs," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2014.
[5] R. Harada, M. Hashimoto, and T. Onoye, "NBTI Characterization Using Pulse-Width Modulation," IEEE/ACM Workshop on Variability Modeling and Characterization, November 2013.
[6] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Impact of NBTI-­Induced Pulse-Width Modulation on SET Pulse-Width Measurement," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2012.
[7] R. Harada, S. Abe, H. Fuketa, T. Uemura, M. Hashimoto, and Y. Watanabe, "Angular Dependency of Neutron Induced Multiple Cell Upsets in 65-nm 10T Subthreshold SRAM," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2012.
[8] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "SET Pulse-Width Measurement Eliminating Pulse-Width Modulation and Within-Die Process Variation Effects," Proceedings of International Reliability Physics Symposium (IRPS), April 2012. [168.PDF]
[9] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Neutron Induced Single Event Multiple Transients with Voltage Scaling and Body Biasing," Proceedings of International Reliability Physics Symposium (IRPS), pages 253--257, April 2011. [156.PDF]
[10] R. Harada, Y. Mitsuyama, M. Hashimoto, and T. Onoye, "Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-inverter-delay Resolution," Proceedings of International Symposium on Quality Electronic Design (ISQED), pages 839--844, March 2010. [138.pdf]