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この検索内の頻出タグ: 20-nm:1 alpha:1 characterization:1 comparative:1 muon-induced:1 neutrons:1 particles:1 single-event:1 srams:1 upsets:1

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論文誌
[1] T. Kato, M. Tampo, S. Takeshita, H. Tanaka, H. Matsuyama, M. Hashimoto, and Y. Miyake, "Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha Particles," IEEE Transactions on Nuclear Science, volume 68, number 7, pages 1436-1444, July 2021. [pdf]