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この検索内の頻出タグ: 20-nm:1 alpha-particles:1 characterization:1 comparative:1 muon-induced:1 neutrons:1 single-event:1 srams:1 upsets:1

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国際会議
[1] T. Kato, M. Tampo, S. Takeshita, Y. Miyake, H Tanaka, and M. Hashimoto, "Muon-Induced Single-Event Upsets in 20-nm SRAMs: Comparative Characterization with Neutrons and Alpha-Particles," IEEE Nuclear and Space Radiation Effects Conference (NSREC), November 2020.