Detail of a work
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W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, and Y. Miyake, "Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2017. | |
ID | 453 |
分類 | 国際会議 |
タグ | 65nm bulk induced investigation measurement mechanism muon negative positive srams upsets |
表題 (title) |
Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk SRAMs |
表題 (英文) |
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著者名 (author) |
W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,K. Nakano,H. Sato,T. Kin,K. Hamada,M. Tampo,Y. Miyake |
英文著者名 (author) |
W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,K. Nakano,H. Sato,T. Kin,K. Hamada,M. Tampo,Y. Miyake |
キー (key) |
W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,K. Nakano,H. Sato,T. Kin,K. Hamada,M. Tampo,Y. Miyake |
定期刊行物名 (journal) |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
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刊行月 (month) |
10 |
出版年 (year) |
2017 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | 利用できません. |
BiBTeXエントリ |
@article{id453, title = {Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk {SRAMs}}, author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and K. Nakano and H. Sato and T. Kin and K. Hamada and M. Tampo and Y. Miyake}, journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)}, month = {10}, year = {2017}, } |