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W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, and Y. Miyake, "Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), October 2017.
ID 453
分類 国際会議
タグ 65nm bulk induced investigation measurement mechanism muon negative positive srams upsets
表題 (title) Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk SRAMs
表題 (英文)
著者名 (author) W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,K. Nakano,H. Sato,T. Kin,K. Hamada,M. Tampo,Y. Miyake
英文著者名 (author) W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,K. Nakano,H. Sato,T. Kin,K. Hamada,M. Tampo,Y. Miyake
キー (key) W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,K. Nakano,H. Sato,T. Kin,K. Hamada,M. Tampo,Y. Miyake
定期刊行物名 (journal) Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) 10
出版年 (year) 2017
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@article{id453,
         title = {Measurement and Mechanism Investigation of Negative and Positive Muon Induced Upsets in 65nm Bulk {SRAMs}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and K. Nakano and H. Sato and T. Kin and K. Hamada and M. Tampo and Y. Miyake},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {10},
          year = {2017},
}