Language: 英語 | 日本語 || ログイン |

1 件の該当がありました. : このページのURL : HTML

W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, and Y. Miyake, "Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs," IEEE Transactions on Nuclear Science, 65(8), pp. 1734--1741, August 2018.
ID 477
分類 論文誌
タグ 65nm bulk investigation measurement mechanism muon-induced negative positive srams upsets
表題 (title) Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs
表題 (英文)
著者名 (author) W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,K. Nakano,H. Sato,T. Kin,K. Hamada,M. Tampo,Y. Miyake
英文著者名 (author) W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,K. Nakano,H. Sato,T. Kin,K. Hamada,M. Tampo,Y. Miyake
キー (key) W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,K. Nakano,H. Sato,T. Kin,K. Hamada,M. Tampo,Y. Miyake
定期刊行物名 (journal) IEEE Transactions on Nuclear Science
定期刊行物名 (英文)
巻数 (volume) 65
号数 (number) 8
ページ範囲 (pages) 1734--1741
刊行月 (month) 8
出版年 (year) 2018
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル pdf (application/pdf) [一般閲覧可]
BiBTeXエントリ
@article{id477,
         title = {Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in {65-nm} Bulk {SRAMs}},
        author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and K. Nakano and H. Sato and T. Kin and K. Hamada and M. Tampo and Y. Miyake},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {65},
        number = {8},
         pages = {1734--1741},
         month = {8},
          year = {2018},
}