Detail of a work
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W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, and Y. Miyake, "Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs," IEEE Transactions on Nuclear Science, 65(8), pp. 1734--1741, August 2018. | |
ID | 477 |
分類 | 論文誌 |
タグ | 65nm bulk investigation measurement mechanism muon-induced negative positive srams upsets |
表題 (title) |
Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs |
表題 (英文) |
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著者名 (author) |
W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,K. Nakano,H. Sato,T. Kin,K. Hamada,M. Tampo,Y. Miyake |
英文著者名 (author) |
W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,K. Nakano,H. Sato,T. Kin,K. Hamada,M. Tampo,Y. Miyake |
キー (key) |
W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,K. Nakano,H. Sato,T. Kin,K. Hamada,M. Tampo,Y. Miyake |
定期刊行物名 (journal) |
IEEE Transactions on Nuclear Science |
定期刊行物名 (英文) |
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巻数 (volume) |
65 |
号数 (number) |
8 |
ページ範囲 (pages) |
1734--1741 |
刊行月 (month) |
8 |
出版年 (year) |
2018 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id477, title = {Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in {65-nm} Bulk {SRAMs}}, author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and K. Nakano and H. Sato and T. Kin and K. Hamada and M. Tampo and Y. Miyake}, journal = {IEEE Transactions on Nuclear Science}, volume = {65}, number = {8}, pages = {1734--1741}, month = {8}, year = {2018}, } |