: W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, and Y. Miyake, Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs, August 2018.
Detail of a work
| Tweet | |
| W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, K. Nakano, H. Sato, T. Kin, K. Hamada, M. Tampo, and Y. Miyake, "Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs," IEEE Transactions on Nuclear Science, 65(8), pp. 1734--1741, August 2018. | |
| ID | 477 |
| 分類 | 論文誌 |
| タグ | 65nm bulk investigation measurement mechanism muon-induced negative positive srams upsets |
| 表題 (title) |
Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs |
| 表題 (英文) |
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| 著者名 (author) |
W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,K. Nakano,H. Sato,T. Kin,K. Hamada,M. Tampo,Y. Miyake |
| 英文著者名 (author) |
W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,K. Nakano,H. Sato,T. Kin,K. Hamada,M. Tampo,Y. Miyake |
| キー (key) |
W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,K. Nakano,H. Sato,T. Kin,K. Hamada,M. Tampo,Y. Miyake |
| 定期刊行物名 (journal) |
IEEE Transactions on Nuclear Science |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
65 |
| 号数 (number) |
8 |
| ページ範囲 (pages) |
1734--1741 |
| 刊行月 (month) |
8 |
| 出版年 (year) |
2018 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id477,
title = {Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in {65-nm} Bulk {SRAMs}},
author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and K. Nakano and H. Sato and T. Kin and K. Hamada and M. Tampo and Y. Miyake},
journal = {IEEE Transactions on Nuclear Science},
volume = {65},
number = {8},
pages = {1734--1741},
month = {8},
year = {2018},
}
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