Detail of a work
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W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, S. Abe, M. Tampo, S. Takeshita, and Y. Miyake, "Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs," Proceedings of International Reliability Physics Symposium (IRPS), April 2019. | |
ID | 500 |
分類 | 国際会議 |
タグ | 28-nm 65-nm bulk cmos cross muon-induced negative planar positive sections seu srams |
表題 (title) |
Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs |
表題 (英文) |
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著者名 (author) |
W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,S. Abe,M. Tampo,S. Takeshita,Y. Miyake |
英文著者名 (author) |
W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,S. Abe,M. Tampo,,Y. Miyake |
キー (key) |
W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,S. Abe,M. Tampo,,Y. Miyake |
定期刊行物名 (journal) |
Proceedings of International Reliability Physics Symposium (IRPS) |
定期刊行物名 (英文) |
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巻数 (volume) |
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号数 (number) |
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ページ範囲 (pages) |
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刊行月 (month) |
4 |
出版年 (year) |
2019 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id500, title = {Negative and Positive Muon-induced {SEU} Cross Sections in {28-nm} and {65-nm} Planar Bulk {CMOS} {SRAMs}}, author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and S. Abe and M. Tampo and S. Takeshita and Y. Miyake}, journal = {Proceedings of International Reliability Physics Symposium (IRPS)}, month = {4}, year = {2019}, } |