: S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, K. Nakano, H. Sato, T. Kin, S. Abe, K. Hamada, M. Tampo, and Y. Miyake, Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs, August 2018.
Detail of a work
| Tweet | |
| S. Manabe, Y. Watanabe, W. Liao, M. Hashimoto, K. Nakano, H. Sato, T. Kin, S. Abe, K. Hamada, M. Tampo, and Y. Miyake, "Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs," IEEE Transactions on Nuclear Science, 65(8), pp. 1742--1749, August 2018. | |
| ID | 476 |
| 分類 | 論文誌 |
| タグ | 65-nm event muon-induced negative positive single soi srams upsets utbb |
| 表題 (title) |
Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs |
| 表題 (英文) |
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| 著者名 (author) |
S. Manabe,Y. Watanabe,W. Liao,M. Hashimoto,K. Nakano,H. Sato,T. Kin,S. Abe,K. Hamada,M. Tampo,Y. Miyake |
| 英文著者名 (author) |
S. Manabe,Y. Watanabe,W. Liao,M. Hashimoto,K. Nakano,H. Sato,T. Kin,S. Abe,K. Hamada,M. Tampo,Y. Miyake |
| キー (key) |
S. Manabe,Y. Watanabe,W. Liao,M. Hashimoto,K. Nakano,H. Sato,T. Kin,S. Abe,K. Hamada,M. Tampo,Y. Miyake |
| 定期刊行物名 (journal) |
IEEE Transactions on Nuclear Science |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
65 |
| 号数 (number) |
8 |
| ページ範囲 (pages) |
1742--1749 |
| 刊行月 (month) |
8 |
| 出版年 (year) |
2018 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id476,
title = {Negative and Positive Muon-Induced Single Event Upsets in {65-nm} {UTBB} {SOI} {SRAMs}},
author = {S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and K. Nakano and H. Sato and T. Kin and S. Abe and K. Hamada and M. Tampo and Y. Miyake},
journal = {IEEE Transactions on Nuclear Science},
volume = {65},
number = {8},
pages = {1742--1749},
month = {8},
year = {2018},
}
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