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S. Abe, W. Liao, S. Manabe, T. Sato, M. Hashimoto, and Y. Watanabe, "Impact of Irradiation Side on Neutron-Induced Single Event Upsets in 65-nm Bulk SRAMs," IEEE Transactions on Nuclear Science, 66(7), 1374 -- 1380, July 2019.
ID 506
分類 論文誌
タグ 65-nm bulk event impact irradiation neutron-induced side single srams upsets
表題 (title) Impact of Irradiation Side on Neutron-Induced Single Event Upsets in 65-nm Bulk SRAMs
表題 (英文)
著者名 (author) S. Abe,W. Liao,S. Manabe,T. Sato,M. Hashimoto,Y. Watanabe
英文著者名 (author) S. Abe,W. Liao,S. Manabe,T. Sato,M. Hashimoto,
キー (key) S. Abe,W. Liao,S. Manabe,T. Sato,M. Hashimoto,
定期刊行物名 (journal) IEEE Transactions on Nuclear Science
定期刊行物名 (英文)
巻数 (volume) 66
号数 (number) 7
ページ範囲 (pages) 1374 -- 1380
刊行月 (month) 7
出版年 (year) 2019
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
論文電子ファイル pdf (application/pdf) [一般閲覧可]
BiBTeXエントリ
@article{id506,
         title = {Impact of Irradiation Side on Neutron-induced Single Event Upsets in {65-nm} Bulk {SRAMs}},
        author = {S. Abe and W. Liao and S. Manabe and T. Sato and M. Hashimoto and Y.  Watanabe},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {66},
        number = {7},
         pages = {1374 -- 1380},
         month = {7},
          year = {2019},
}