: Y. Gomi, K. Takami, R. Mizuno, M. Niikura, R. Yasuda, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs, September 2024.
Detail of a work
| Tweet | |
| Y. Gomi, K. Takami, R. Mizuno, M. Niikura, R. Yasuda, Y. Deng, S. Kawase, Y. Watanabe, S. Abe, W. Liao, M. Tampo, S. Takeshita, K. Shimomura, Y. Miyake, and M. Hashimoto, "Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2024. | |
| ID | 637 |
| 分類 | 国際会議 |
| タグ | 12-nm analysis cell different finfet muon-induced seu simulation srams types |
| 表題 (title) |
Muon-Induced SEU Analysis and Simulation for Different Cell Types in 12-nm FinFET SRAMs |
| 表題 (英文) |
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| 著者名 (author) |
Y. Gomi,K. Takami,R. Mizuno,M. Niikura,R. Yasuda,Y. Deng,S. Kawase,Y. Watanabe,S. Abe,W. Liao,M. Tampo,S. Takeshita,K. Shimomura,Y. Miyake,M. Hashimoto |
| 英文著者名 (author) |
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| 定期刊行物名 (journal) |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
9 |
| 出版年 (year) |
2024 |
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| 付加情報 (note) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id637,
title = {Muon-induced {SEU} Analysis and Simulation for Different Cell Types in {12-nm} {FinFET} {SRAMs}},
author = {Y. Gomi and K. Takami and R. Mizuno and M. Niikura and R. Yasuda and Y. Deng and S. Kawase and Y. Watanabe and S. Abe and W. Liao and M. Tampo and S. Takeshita and K. Shimomura and Y. Miyake and M. Hashimoto},
journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
month = {9},
year = {2024},
}
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