: T. Kato, M. Hashimoto, and H. Matsuyama, Angular Sensitivity of Neutron-Induced Single-Event Upsets in 12-nm FinFET SRAMs with Comparison to 20-nm Planar SRAMs, July 2020.
Detail of a work
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| T. Kato, M. Hashimoto, and H. Matsuyama, "Angular Sensitivity of Neutron-Induced Single-Event Upsets in 12-nm FinFET SRAMs with Comparison to 20-nm Planar SRAMs," IEEE Transactions on Nuclear Science, 67(7), 1485 -- 1493, July 2020. | |
| ID | 547 |
| 分類 | 論文誌 |
| タグ | 12-nm 20-nm angular comparison finfet neutron-induced planar sensitivity single-event srams upsets |
| 表題 (title) |
Angular Sensitivity of Neutron-Induced Single-Event Upsets in 12-nm FinFET SRAMs with Comparison to 20-nm Planar SRAMs |
| 表題 (英文) |
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| 著者名 (author) |
T. Kato,M. Hashimoto,H. Matsuyama |
| 英文著者名 (author) |
T. Kato,M. Hashimoto,H. Matsuyama |
| キー (key) |
T. Kato,M. Hashimoto,H. Matsuyama |
| 定期刊行物名 (journal) |
IEEE Transactions on Nuclear Science |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
67 |
| 号数 (number) |
7 |
| ページ範囲 (pages) |
1485 -- 1493 |
| 刊行月 (month) |
7 |
| 出版年 (year) |
2020 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
| BiBTeXエントリ |
@article{id547,
title = {Angular Sensitivity of Neutron-Induced Single-Event Upsets in {12-nm} {FinFET} {SRAMs} with Comparison to {20-nm} Planar {SRAMs}},
author = {T. Kato and M. Hashimoto and H. Matsuyama},
journal = {IEEE Transactions on Nuclear Science},
volume = {67},
number = {7},
pages = {1485 -- 1493},
month = {7},
year = {2020},
}
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