Detail of a work
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T. Kato, M. Hashimoto, and H. Matsuyama, "Angular Sensitivity of Neutron-Induced Single-Event Upsets in 12-nm FinFET SRAMs with Comparison to 20-nm Planar SRAMs," IEEE Transactions on Nuclear Science, 67(7), 1485 -- 1493, July 2020. | |
ID | 547 |
分類 | 論文誌 |
タグ | 12-nm 20-nm angular comparison finfet neutron-induced planar sensitivity single-event srams upsets |
表題 (title) |
Angular Sensitivity of Neutron-Induced Single-Event Upsets in 12-nm FinFET SRAMs with Comparison to 20-nm Planar SRAMs |
表題 (英文) |
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著者名 (author) |
T. Kato,M. Hashimoto,H. Matsuyama |
英文著者名 (author) |
T. Kato,M. Hashimoto,H. Matsuyama |
キー (key) |
T. Kato,M. Hashimoto,H. Matsuyama |
定期刊行物名 (journal) |
IEEE Transactions on Nuclear Science |
定期刊行物名 (英文) |
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巻数 (volume) |
67 |
号数 (number) |
7 |
ページ範囲 (pages) |
1485 -- 1493 |
刊行月 (month) |
7 |
出版年 (year) |
2020 |
Impact Factor (JCR) |
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URL |
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付加情報 (note) |
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注釈 (annote) |
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内容梗概 (abstract) |
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論文電子ファイル | pdf (application/pdf) [一般閲覧可] |
BiBTeXエントリ |
@article{id547, title = {Angular Sensitivity of Neutron-Induced Single-Event Upsets in {12-nm} {FinFET} {SRAMs} with Comparison to {20-nm} Planar {SRAMs}}, author = {T. Kato and M. Hashimoto and H. Matsuyama}, journal = {IEEE Transactions on Nuclear Science}, volume = {67}, number = {7}, pages = {1485 -- 1493}, month = {7}, year = {2020}, } |