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論文誌
[1] Y. Ogasahara, T. Enami, M. Hashimoto, T. Sato, and T. Onoye, "Validation of a Full-Chip Simulation Model for Supply Noise and Delay Dependence on Average Voltage Drop with On-Chip Delay Measurement," IEEE Transactions on Circuits and Systems II, volume 54, number 10, pages 868--872, October 2007. [94.pdf]