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W. Liao, M. Hashimoto, S. Manabe, S. Abe, and Y. Watanabe, "Similarity Analysis on Neutron- and Negative Moun-Induced MCUs in 65-nm Bulk SRAM," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2018.
ID 483
分類 国際会議
タグ 65-nm analysis bulk mcus moun-induced negative neutron- similarity sram
表題 (title) Similarity Analysis on Neutron- and Negative Moun-Induced MCUs in 65-nm Bulk SRAM
表題 (英文)
著者名 (author) W. Liao,M. Hashimoto,S. Manabe,S. Abe,Y. Watanabe
英文著者名 (author) W. Liao,M. Hashimoto,S. Manabe,S. Abe,Y. Watanabe
キー (key) W. Liao,M. Hashimoto,S. Manabe,S. Abe,Y. Watanabe
定期刊行物名 (journal) Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)
定期刊行物名 (英文)
巻数 (volume)
号数 (number)
ページ範囲 (pages)
刊行月 (month) 9
出版年 (year) 2018
Impact Factor (JCR)
URL
付加情報 (note)
注釈 (annote)
内容梗概 (abstract)
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BiBTeXエントリ
@article{id483,
         title = {Similarity analysis on neutron- and negative moun-induced {MCUs} in {65-nm} bulk {SRAM}},
        author = {W. Liao and M. Hashimoto and S. Manabe and S. Abe and Y. Watanabe},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2018},
}