: W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, S. Abe, M. Tampo, S. Takeshita, and Y. Miyake, Impact of Incident Angle on Negative Muon-Induced SEU Cross Section of 65-nm Bulk SRAM, September 2019.
Detail of a work
| Tweet | |
| W. Liao, M. Hashimoto, S. Manabe, Y. Watanabe, S. Abe, M. Tampo, S. Takeshita, and Y. Miyake, "Impact of Incident Angle on Negative Muon-Induced SEU Cross Section of 65-nm Bulk SRAM," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2019. | |
| ID | 520 |
| 分類 | 国際会議 |
| タグ | 65-nm angle bulk cross impact incident muon-induced negative section seu sram |
| 表題 (title) |
Impact of Incident Angle on Negative Muon-Induced SEU Cross Section of 65-nm Bulk SRAM |
| 表題 (英文) |
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| 著者名 (author) |
W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,S. Abe,M. Tampo,S. Takeshita,Y. Miyake |
| 英文著者名 (author) |
W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,S. Abe,M. Tampo,,Y. Miyake |
| キー (key) |
W. Liao,M. Hashimoto,S. Manabe,Y. Watanabe,S. Abe,M. Tampo,,Y. Miyake |
| 定期刊行物名 (journal) |
Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS) |
| 定期刊行物名 (英文) |
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| 巻数 (volume) |
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| 号数 (number) |
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| ページ範囲 (pages) |
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| 刊行月 (month) |
9 |
| 出版年 (year) |
2019 |
| Impact Factor (JCR) |
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| URL |
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| 付加情報 (note) |
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| 注釈 (annote) |
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| 内容梗概 (abstract) |
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| 論文電子ファイル | 利用できません． |
| BiBTeXエントリ |
@article{id520,
title = {Impact of Incident Angle on Negative Muon-induced {SEU} Cross Section of {65-nm} Bulk {SRAM}},
author = {W. Liao and M. Hashimoto and S. Manabe and Y. Watanabe and S. Abe and M. Tampo and S. Takeshita and Y. Miyake},
journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
month = {9},
year = {2019},
}
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