Frequent tags in this search: rates^:4 65-nm^:3 bulk^:3 srams^:3 characterizing^:2 error^:2 estimation^:2 muon-induced^:2 seu^:2 soft^:2 utbb-soi^:2 beams^:1 ff^:1 invited^:1 measurement^:1 muon^:1 neutron^:1 simulation^:1 sotb^:1 sram^:1

4 publications are found. : URL for this page. : HTML

@article{id508,
         title = {Characterizing {SRAM} and {FF} Soft Error Rates with Measurement and Simulation (Invited)},
        author = {M. Hashimoto and K. Kobayashi and J. Furuta and S. Abe and Y. Watanabe},
       journal = {Integration, the VLSI Journal},
        volume = {69},
         pages = {161--179},
         month = {11},
          year = {2019},
}

@article{id511,
         title = {Estimation of Muon-Induced {SEU} Rates for {65-nm} Bulk and {UTBB-SOI} {SRAMs}},
        author = {S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and S. Abe},
       journal = {IEEE Transactions on Nuclear Science},
        volume = {66},
        number = {7},
         pages = {1398 -- 1403},
         month = {7},
          year = {2019},
}

@article{id496,
         title = {Characterizing soft error rates of {65-nm} {SOTB} and bulk {SRAMs} with muon and neutron beams (Invited)},
        author = {M. Hashimoto and W. Liao and S. Manabe and Y. Watanabe},
       journal = {Proceedings of SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)},
         month = {10},
          year = {2018},
}

@article{id482,
         title = {Estimation of Muon-Induced {SEU} Rates for {65-nm} Bulk and {UTBB-SOI} {SRAMs}},
        author = {S. Manabe and Y. Watanabe and W. Liao and M. Hashimoto and S. Abe},
       journal = {Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS)},
         month = {9},
          year = {2018},
}