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この検索内の頻出タグ: alpha-:2 bulk:2 mcu:2 neutron-induced:2 seu:2 sotb:2 srams:2 0.4:1 0.4-v:1 characterizing:1 measurement:1 v:1

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論文誌
[1] S. Hirokawa, R. Harada, M. Hashimoto, and T. Onoye, "Characterizing Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4-V SRAMs," IEEE Transactions on Nuclear Science, volume 62, number 2, pages 420--427, April 2015. [219.pdf]
国際会議
[1] R. Harada, S. Hirokawa, and M. Hashimoto, "Measurement of Alpha- and Neutron-Induced SEU and MCU on SOTB and Bulk 0.4 V SRAMs," IEEE Nuclear and Space Radiation Effects Conference (NSREC), July 2014.