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論文誌

[1] Yuibi Gomi, Kazusa Takami, Ryuichi Yasuda, Hiroki Kanda, Mitsuhiro Fukuda, and Masanori Hashimoto, "Quasi Event-Wise Measurement and Simulation of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs," IEEE Transactions on Nuclear Science, 採録済.

国際会議

[1] Ryuichi Yasuda, Koichi Fukuda, Junichi Hattori, Kozo Takeuchi, Kozo Takeuchi, and Masanori Hashimoto, "Multi-Cell TCAD Analysis of Parasitic-Bipolar-Effect-Induced Multiple-Cell Upsets in a 12-nm FinFET SRAM," Proceedings of International Conference on Integrated Circuits, Design and Verification (ICDV), 採録済.

[2] Y. Gomi, K. Takami, R. Yasuda, H. Kanda, M. Fukuda, and M. Hashimoto, "Quasi Event-Wise Measurement of Neutron-Induced Multiple-Cell Upsets in 22-nm and 55-nm SRAMs," Proceedings of European Conference on Radiation and Its Effects on Components and Systems (RADECS), September 2025.