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[1] Ryuichi Yasuda, Koichi Fukuda, Junichi Hattori, Kozo Takeuchi, Kozo Takeuchi, and Masanori Hashimoto, "Multi-Cell TCAD Analysis of Parasitic-Bipolar-Effect-Induced Multiple-Cell Upsets in a 12-nm FinFET SRAM," Proceedings of International Conference on Integrated Circuits, Design and Verification (ICDV), 採録済.

[2] M. Hashimoto, W. Liao, and S. Hirokawa, "Soft Error Rate Estimation with TCAD and Machine Learning (Invited)," Proceedings of International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), September 2017. [pdf]